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Unified Diff: test/cctest/test-macro-assembler-arm.cc

Issue 2868603002: [ARM] Improve VFP register moves. (Closed)
Patch Set: Rebase. Created 3 years, 7 months ago
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Index: test/cctest/test-macro-assembler-arm.cc
diff --git a/test/cctest/test-macro-assembler-arm.cc b/test/cctest/test-macro-assembler-arm.cc
index c6951d32309f56829e287d8158bb4cbab2656652..d1748b0be3276854fd13905223fca57b835a2f1c 100644
--- a/test/cctest/test-macro-assembler-arm.cc
+++ b/test/cctest/test-macro-assembler-arm.cc
@@ -169,7 +169,7 @@ TEST(ExtractLane) {
__ ExtractLane(r5, q1, NeonS32, i);
__ str(r5, MemOperand(r0, offsetof(T, i32x4_low) + 4 * i));
SwVfpRegister si = SwVfpRegister::from_code(i);
- __ ExtractLane(si, q1, r4, i);
+ __ ExtractLane(si, q1, i);
__ vstr(si, r0, offsetof(T, f32x4_low) + 4 * i);
}
@@ -203,7 +203,7 @@ TEST(ExtractLane) {
__ ExtractLane(r5, q15, NeonS32, i);
__ str(r5, MemOperand(r0, offsetof(T, i32x4_high) + 4 * i));
SwVfpRegister si = SwVfpRegister::from_code(i);
- __ ExtractLane(si, q15, r4, i);
+ __ ExtractLane(si, q15, i);
__ vstr(si, r0, offsetof(T, f32x4_high) + 4 * i);
}
@@ -304,8 +304,6 @@ TEST(ReplaceLane) {
__ stm(db_w, sp, r4.bit() | r5.bit() | r6.bit() | r7.bit() | lr.bit());
- const Register kScratch = r5;
-
__ veor(q0, q0, q0); // Zero
__ veor(q1, q1, q1); // Zero
for (int i = 0; i < 4; i++) {
@@ -313,7 +311,7 @@ TEST(ReplaceLane) {
__ ReplaceLane(q0, q0, r4, NeonS32, i);
SwVfpRegister si = SwVfpRegister::from_code(i);
__ vmov(si, r4);
- __ ReplaceLane(q1, q1, si, kScratch, i);
+ __ ReplaceLane(q1, q1, si, i);
}
__ add(r4, r0, Operand(static_cast<int32_t>(offsetof(T, i32x4_low))));
__ vst1(Neon8, NeonListOperand(q0), NeonMemOperand(r4));
@@ -344,7 +342,7 @@ TEST(ReplaceLane) {
__ ReplaceLane(q14, q14, r4, NeonS32, i);
SwVfpRegister si = SwVfpRegister::from_code(i);
__ vmov(si, r4);
- __ ReplaceLane(q15, q15, si, kScratch, i);
+ __ ReplaceLane(q15, q15, si, i);
}
__ add(r4, r0, Operand(static_cast<int32_t>(offsetof(T, i32x4_high))));
__ vst1(Neon8, NeonListOperand(q14), NeonMemOperand(r4));
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