tests_lit/assembler/x86/jump_encodings.ll - Issue 1395693005: Subzero: Implement "second-chance bin-packing" for register allocation.

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Unified Diff: tests_lit/assembler/x86/jump_encodings.ll

Issue 1395693005: Subzero: Implement "second-chance bin-packing" for register allocation. (Closed) Base URL: https://chromium.googlesource.com/native_client/pnacl-subzero.git@master

Patch Set: Change the internal flag name. Fix a broken MINIMAL=1 test. Created 5 years, 2 months ago

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Index: tests_lit/assembler/x86/jump_encodings.ll

diff --git a/tests_lit/assembler/x86/jump_encodings.ll b/tests_lit/assembler/x86/jump_encodings.ll

index e8c9e1dc9d320e63d1e1720be292eaeef58aad53..c8ffdb3d126fccfb17f2ab76881b441a8a7dbb81 100644

--- a/tests_lit/assembler/x86/jump_encodings.ll

+++ b/tests_lit/assembler/x86/jump_encodings.ll

@@ -172,11 +172,11 @@ next2:

; CHECK-LABEL: test_local_forward_then_back

; CHECK: {{.*}} mov DWORD PTR

; CHECK-NEXT: {{.*}} mfence

-; CHECK-NEXT: 16: {{.*}} mov {{.*}},0x1

+; CHECK-NEXT: [[LABEL:[0-9a-f]+]]: {{.*}} mov {{.*}},0x1

; CHECK-NEXT: {{.*}} cmp

; CHECK-NEXT: {{.*}} jb

; CHECK: {{.*}} jne

-; CHECK: {{.*}} jmp 16

+; CHECK: {{.*}} jmp [[LABEL]]

; Test that backward local branches also work and are small.

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