tests_lit/assembler/arm32/ret.ll - Issue 1395693005: Subzero: Implement "second-chance bin-packing" for register allocation.

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Unified Diff: tests_lit/assembler/arm32/ret.ll

Issue 1395693005: Subzero: Implement "second-chance bin-packing" for register allocation. (Closed) Base URL: https://chromium.googlesource.com/native_client/pnacl-subzero.git@master

Patch Set: Change the internal flag name. Fix a broken MINIMAL=1 test. Created 5 years, 2 months ago

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Index: tests_lit/assembler/arm32/ret.ll

diff --git a/tests_lit/assembler/arm32/ret.ll b/tests_lit/assembler/arm32/ret.ll

index 27596c97ea801320b25b6fa252f204cb413a0098..95fce9771234b5e5b9b4bd2302cedc4031948139 100644

--- a/tests_lit/assembler/arm32/ret.ll

+++ b/tests_lit/assembler/arm32/ret.ll

@@ -1,6 +1,8 @@

; Shows that the ARM integrated assembler can translate a trivial,

; bundle-aligned function.

+; REQUIRES: allow_dump

; RUN: %p2i --filetype=asm -i %s --target=arm32 \

; RUN: | FileCheck %s --check-prefix=ASM

; RUN: %p2i --filetype=iasm -i %s --target=arm32 \

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