| Index: icu46/source/test/intltest/tsputil.h
|
| ===================================================================
|
| --- icu46/source/test/intltest/tsputil.h (revision 0)
|
| +++ icu46/source/test/intltest/tsputil.h (revision 0)
|
| @@ -0,0 +1,47 @@
|
| +/********************************************************************
|
| + * COPYRIGHT:
|
| + * Copyright (c) 1997-2005, International Business Machines Corporation and
|
| + * others. All Rights Reserved.
|
| + ********************************************************************/
|
| +
|
| +
|
| +#ifndef _PUTILTEST_
|
| +#define _PUTILTEST_
|
| +
|
| +#include "intltest.h"
|
| +
|
| +/**
|
| + * Test putil.h
|
| + **/
|
| +class PUtilTest : public IntlTest {
|
| + // IntlTest override
|
| + void runIndexedTest( int32_t index, UBool exec, const char* &name, char* par );
|
| +public:
|
| +
|
| +// void testIEEEremainder(void);
|
| + void testMaxMin(void);
|
| +
|
| +private:
|
| +// void remainderTest(double x, double y, double exp);
|
| + void maxMinTest(double a, double b, double exp, UBool max);
|
| +
|
| + // the actual tests; methods return the number of errors
|
| + void testNaN(void);
|
| + void testPositiveInfinity(void);
|
| + void testNegativeInfinity(void);
|
| + void testZero(void);
|
| + void testU_INLINE();
|
| +
|
| + // subtests of testNaN
|
| + void testIsNaN(void);
|
| + void NaNGT(void);
|
| + void NaNLT(void);
|
| + void NaNGTE(void);
|
| + void NaNLTE(void);
|
| + void NaNE(void);
|
| + void NaNNE(void);
|
| +
|
| +};
|
| +
|
| +#endif
|
| +//eof
|
|
|
| Property changes on: icu46/source/test/intltest/tsputil.h
|
| ___________________________________________________________________
|
| Added: svn:eol-style
|
| + LF
|
|
|
|
|