Satisfy new -Wunused-local-typedefs in gcc 4.8 in the simulators.

runtime/vm/assembler_mips_test.cc

 // Copyright (c) 2013, the Dart project authors.  Please see the AUTHORS file
 // for details. All rights reserved. Use of this source code is governed by a
 // BSD-style license that can be found in the LICENSE file.
 
 #include "vm/globals.h"
 #if defined(TARGET_ARCH_MIPS)
 
 #include "vm/assembler.h"
 #include "vm/cpu.h"
 #include "vm/os.h"
 #include "vm/unit_test.h"
 #include "vm/virtual_memory.h"
 
 namespace dart {
 
 #define __ assembler->
 
 ASSEMBLER_TEST_GENERATE(Simple, assembler) {
   __ LoadImmediate(V0, 42);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Simple, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Addiu, assembler) {
   __ addiu(V0, ZR, Immediate(42));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Addiu, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Addiu_overflow, assembler) {
   __ LoadImmediate(V0, 0x7fffffff);
   __ addiu(V0, V0, Immediate(1));  // V0 is modified on overflow.
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Addiu_overflow, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(static_cast<int32_t>(0x80000000),
             EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Addu, assembler) {
   __ addiu(T2, ZR, Immediate(21));
   __ addiu(T3, ZR, Immediate(21));
   __ addu(V0, T2, T3);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Addu, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Addu_overflow, assembler) {
   __ LoadImmediate(T2, 0x7fffffff);
   __ addiu(T3, R0, Immediate(1));
   __ addu(V0, T2, T3);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Addu_overflow, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(static_cast<int32_t>(0x80000000),
             EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(And, assembler) {
   __ addiu(T2, ZR, Immediate(42));
   __ addiu(T3, ZR, Immediate(2));
   __ and_(V0, T2, T3);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(And, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Andi, assembler) {
   __ addiu(T1, ZR, Immediate(42));
   __ andi(V0, T1, Immediate(2));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Andi, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Clo, assembler) {
   __ addiu(T1, ZR, Immediate(-1));
   __ clo(V0, T1);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Clo, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Clz, assembler) {
   __ addiu(T1, ZR, Immediate(0x7fff));
   __ clz(V0, T1);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Clz, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(17, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(MtloMflo, assembler) {
   __ LoadImmediate(T0, 42);
   __ mtlo(T0);
   __ mflo(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(MtloMflo, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(MthiMfhi, assembler) {
   __ LoadImmediate(T0, 42);
   __ mthi(T0);
   __ mfhi(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(MthiMfhi, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Divu, assembler) {
   __ addiu(T1, ZR, Immediate(27));
   __ addiu(T2, ZR, Immediate(9));
   __ divu(T1, T2);
   __ mflo(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Divu, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(3, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Div, assembler) {
   __ addiu(T1, ZR, Immediate(27));
   __ addiu(T2, ZR, Immediate(9));
   __ div(T1, T2);
   __ mflo(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Div, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(3, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Divu_corner, assembler) {
   __ LoadImmediate(T1, 0x80000000);
   __ LoadImmediate(T2, 0xffffffff);
   __ divu(T1, T2);
   __ mflo(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Divu_corner, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Div_corner, assembler) {
   __ LoadImmediate(T1, 0x80000000);
   __ LoadImmediate(T2, 0xffffffff);
   __ div(T1, T2);
   __ mflo(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Div_corner, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(static_cast<int32_t>(0x80000000),
             EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Lb, assembler) {
   __ addiu(SP, SP, Immediate(-kWordSize * 30));
   __ LoadImmediate(T1, 0xff);
   __ sb(T1, Address(SP));
   __ lb(V0, Address(SP));
   __ addiu(SP, SP, Immediate(kWordSize * 30));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Lb, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Lb_offset, assembler) {
   __ addiu(SP, SP, Immediate(-kWordSize * 30));
   __ LoadImmediate(T1, 0xff);
   __ sb(T1, Address(SP, 1));
   __ lb(V0, Address(SP, 1));
   __ addiu(SP, SP, Immediate(kWordSize * 30));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Lb_offset, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Lbu, assembler) {
   __ addiu(SP, SP, Immediate(-kWordSize * 30));
   __ LoadImmediate(T1, 0xff);
   __ sb(T1, Address(SP));
   __ lbu(V0, Address(SP));
   __ addiu(SP, SP, Immediate(kWordSize * 30));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Lbu, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(255, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Lh, assembler) {
   __ addiu(SP, SP, Immediate(-kWordSize * 30));
   __ LoadImmediate(T1, 0xffff);
   __ sh(T1, Address(SP));
   __ lh(V0, Address(SP));
   __ addiu(SP, SP, Immediate(kWordSize * 30));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Lh, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Lhu, assembler) {
   __ addiu(SP, SP, Immediate(-kWordSize * 30));
   __ LoadImmediate(T1, 0xffff);
   __ sh(T1, Address(SP));
   __ lhu(V0, Address(SP));
   __ addiu(SP, SP, Immediate(kWordSize * 30));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Lhu, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(65535, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Lw, assembler) {
   __ addiu(SP, SP, Immediate(-kWordSize * 30));
   __ LoadImmediate(T1, -1);
   __ sw(T1, Address(SP));
   __ lw(V0, Address(SP));
   __ addiu(SP, SP, Immediate(kWordSize * 30));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Lw, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Lui, assembler) {
   __ lui(V0, Immediate(42));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Lui, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42 << 16, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Sll, assembler) {
   __ LoadImmediate(T1, 21);
   __ sll(V0, T1, 1);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Sll, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Srl, assembler) {
   __ LoadImmediate(T1, 84);
   __ srl(V0, T1, 1);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Srl, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(LShifting, assembler) {
   __ LoadImmediate(T1, 1);
   __ sll(T1, T1, 31);
   __ srl(V0, T1, 31);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(LShifting, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(RShifting, assembler) {
   __ LoadImmediate(T1, 1);
   __ sll(T1, T1, 31);
   __ sra(V0, T1, 31);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(RShifting, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Sllv, assembler) {
   __ LoadImmediate(T1, 21);
   __ LoadImmediate(T2, 1);
   __ sllv(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Sllv, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Srlv, assembler) {
   __ LoadImmediate(T1, 84);
   __ LoadImmediate(T2, 1);
   __ srlv(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Srlv, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(LShiftingV, assembler) {
   __ LoadImmediate(T1, 1);
   __ LoadImmediate(T2, 31);
   __ sllv(T1, T1, T2);
   __ srlv(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(LShiftingV, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(RShiftingV, assembler) {
   __ LoadImmediate(T1, 1);
   __ LoadImmediate(T2, 31);
   __ sllv(T1, T1, T2);
   __ srav(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(RShiftingV, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Mult_pos, assembler) {
   __ LoadImmediate(T1, 6);
   __ LoadImmediate(T2, 7);
   __ mult(T1, T2);
   __ mflo(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Mult_pos, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Mult_neg, assembler) {
   __ LoadImmediate(T1, -6);
   __ LoadImmediate(T2, 7);
   __ mult(T1, T2);
   __ mflo(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Mult_neg, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Mult_neg_hi, assembler) {
   __ LoadImmediate(T1, -6);
   __ LoadImmediate(T2, 7);
   __ mult(T1, T2);
   __ mfhi(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Mult_neg_hi, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Multu_lo, assembler) {
   __ LoadImmediate(T1, 6);
   __ LoadImmediate(T2, 7);
   __ multu(T1, T2);
   __ mflo(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Multu_lo, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Multu_hi, assembler) {
   __ LoadImmediate(T1, 65536);
   __ LoadImmediate(T2, 65536);
   __ multu(T1, T2);
   __ mfhi(V0);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Multu_hi, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Madd_neg, assembler) {
   __ LoadImmediate(T1, -6);
   __ LoadImmediate(T2, 7);
   __ mult(T1, T2);
   __ madd(T1, T2);
   __ mflo(V0);
   __ mfhi(V1);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Madd_neg, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-84, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Subu, assembler) {
   __ LoadImmediate(T1, 737);
   __ LoadImmediate(T2, 695);
   __ subu(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Subu, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Or, assembler) {
   __ LoadImmediate(T1, 34);
   __ LoadImmediate(T2, 8);
   __ or_(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Or, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Nor, assembler) {
   __ LoadImmediate(T1, -47);
   __ LoadImmediate(T2, -60);
   __ nor(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Nor, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Xor, assembler) {
   __ LoadImmediate(T1, 51);
   __ LoadImmediate(T2, 25);
   __ xor_(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Xor, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Xori, assembler) {
   __ LoadImmediate(T0, 51);
   __ xori(V0, T0, Immediate(25));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Xori, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Slt, assembler) {
   __ LoadImmediate(T1, -1);
   __ LoadImmediate(T2, 0);
   __ slt(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Slt, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Sltu, assembler) {
   __ LoadImmediate(T1, -1);
   __ LoadImmediate(T2, 0);
   __ sltu(V0, T1, T2);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Sltu, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Movz, assembler) {
   __ LoadImmediate(T1, 42);
   __ LoadImmediate(T2, 23);
   __ slt(T3, T1, T2);
   __ movz(V0, T1, T3);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Movz, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Movn, assembler) {
   __ LoadImmediate(T1, 42);
   __ LoadImmediate(T2, 23);
   __ slt(T3, T2, T1);
   __ movn(V0, T1, T3);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Movn, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Jr_delay, assembler) {
   __ jr(RA);
   __ delay_slot()->ori(V0, ZR, Immediate(42));
 }
 
 
 ASSEMBLER_TEST_RUN(Jr_delay, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_backward, assembler) {
   Label l;
 
   __ LoadImmediate(T1, 0);
   __ LoadImmediate(T2, 1);
   __ Bind(&l);
   __ addiu(T1, T1, Immediate(1));
   __ beq(T1, T2, &l);
   __ ori(V0, T1, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_backward, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_backward_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T1, 0);
   __ LoadImmediate(T2, 1);
   __ Bind(&l);
   __ addiu(T1, T1, Immediate(1));
   __ beq(T1, T2, &l);
   __ ori(V0, T1, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_backward_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_backward_delay, assembler) {
   Label l;
 
   __ LoadImmediate(T1, 0);
   __ LoadImmediate(T2, 1);
   __ Bind(&l);
   __ addiu(T1, T1, Immediate(1));
   __ beq(T1, T2, &l);
   __ delay_slot()->addiu(T1, T1, Immediate(1));
   __ ori(V0, T1, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_backward_delay, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(4, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_taken, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 1);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_taken, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_taken_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 1);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_taken_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_not_taken, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 0);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_not_taken, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_not_taken_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 0);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_not_taken_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_not_taken_far2, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 0);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ nop();
   for (int i = 0; i < (1 << 15); i++) {
     __ nop();
   }
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_not_taken_far2, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_taken2, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 1);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ nop();
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_taken2, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_taken_far2, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 1);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ nop();
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_taken_far2, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_taken_far3, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 1);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ nop();
   for (int i = 0; i < (1 << 15); i++) {
     __ nop();
   }
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_taken_far3, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_taken_delay, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 1);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ delay_slot()->ori(V0, V0, Immediate(1));
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_taken_delay, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(43, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beq_forward_not_taken_delay, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 0);
   __ LoadImmediate(T6, 1);
 
   __ LoadImmediate(V0, 42);
   __ beq(T5, T6, &l);
   __ delay_slot()->ori(V0, V0, Immediate(1));
   __ addiu(V0, V0, Immediate(1));
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beq_forward_not_taken_delay, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(44, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Beql_backward_delay, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 0);
   __ LoadImmediate(T6, 1);
   __ Bind(&l);
   __ addiu(T5, T5, Immediate(1));
   __ beql(T5, T6, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Beql_backward_delay, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(3, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgez, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 3);
   __ Bind(&l);
   __ bgez(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(-1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgez, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgez_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 3);
   __ Bind(&l);
   __ bgez(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(-1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgez_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgez_far2, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 3);
   __ Bind(&l);
   for (int i = 0; i < (1 << 15); i++) {
     __ nop();
   }
   __ bgez(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(-1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgez_far2, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgez_taken_forward_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 1);
 
   __ LoadImmediate(V0, 42);
   __ bgez(T5, &l);
   __ nop();
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgez_taken_forward_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgez_taken_forward_far2, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 1);
 
   __ LoadImmediate(V0, 42);
   __ bgez(T5, &l);
   __ nop();
   for (int i = 0; i < (1 << 15); i++) {
     __ nop();
   }
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgez_taken_forward_far2, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgez_not_taken_forward_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, -1);
 
   __ LoadImmediate(V0, 42);
   __ bgez(T5, &l);
   __ nop();
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgez_not_taken_forward_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgez_not_taken_forward_far2, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, -1);
 
   __ LoadImmediate(V0, 42);
   __ bgez(T5, &l);
   __ nop();
   for (int i = 0; i < (1 << 15); i++) {
     __ nop();
   }
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgez_not_taken_forward_far2, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgezl, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 3);
   __ Bind(&l);
   __ bgezl(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(-1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgezl, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Blez, assembler) {
   Label l;
 
   __ LoadImmediate(T5, -3);
   __ Bind(&l);
   __ blez(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Blez, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Blez_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, -3);
   __ Bind(&l);
   __ blez(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Blez_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Blez_far2, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, -3);
   __ Bind(&l);
   for (int i = 0; i < (1 << 15); i++) {
     __ nop();
   }
   __ blez(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Blez_far2, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Blez_taken_forward_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, -1);
 
   __ LoadImmediate(V0, 42);
   __ blez(T5, &l);
   __ nop();
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Blez_taken_forward_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Blez_not_taken_forward_far, assembler) {
   Label l;
 
   __ set_use_far_branches(true);
 
   __ LoadImmediate(T5, 1);
 
   __ LoadImmediate(V0, 42);
   __ blez(T5, &l);
   __ nop();
   __ nop();
   __ LoadImmediate(V0, 0);
   __ Bind(&l);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Blez_not_taken_forward_far, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Blezl, assembler) {
   Label l;
 
   __ LoadImmediate(T5, -3);
   __ Bind(&l);
   __ blezl(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Blezl, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgtz, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 3);
   __ Bind(&l);
   __ bgtz(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(-1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgtz, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bgtzl, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 3);
   __ Bind(&l);
   __ bgtzl(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(-1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bgtzl, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bltz, assembler) {
   Label l;
 
   __ LoadImmediate(T5, -3);
   __ Bind(&l);
   __ bltz(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bltz, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bltzl, assembler) {
   Label l;
 
   __ LoadImmediate(T5, -3);
   __ Bind(&l);
   __ bltzl(T5, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bltzl, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bne, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 3);
   __ Bind(&l);
   __ bne(T5, R0, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(-1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bne, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Bnel, assembler) {
   Label l;
 
   __ LoadImmediate(T5, 3);
   __ Bind(&l);
   __ bnel(T5, R0, &l);
   __ delay_slot()->addiu(T5, T5, Immediate(-1));
   __ ori(V0, T5, Immediate(0));
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Bnel, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Label_link1, assembler) {
   Label l;
 
   __ bgez(ZR, &l);
   __ bgez(ZR, &l);
   __ bgez(ZR, &l);
 
   __ LoadImmediate(V0, 1);
   __ Bind(&l);
   __ mov(V0, ZR);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Label_link1, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Label_link2, assembler) {
   Label l;
 
   __ beq(ZR, ZR, &l);
   __ beq(ZR, ZR, &l);
   __ beq(ZR, ZR, &l);
 
   __ LoadImmediate(V0, 1);
   __ Bind(&l);
   __ mov(V0, ZR);
   __ jr(RA);
 }
 
 
 ASSEMBLER_TEST_RUN(Label_link2, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Jalr_delay, assembler) {
   __ mov(T2, RA);
   __ jalr(T2, RA);
   __ delay_slot()->ori(V0, ZR, Immediate(42));
 }
 
 
 ASSEMBLER_TEST_RUN(Jalr_delay, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(AddOverflow_detect, assembler) {
   Register left = T0;
   Register right = T1;
   Register result = T2;
   Register overflow = T3;
   Register scratch = T4;
@@ skipping 46 matching lines @@
 
   __ b(&done);
   __ Bind(&error);
   __ mov(V0, ZR);
   __ Bind(&done);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(AddOverflow_detect, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(SubOverflow_detect, assembler) {
   Register left = T0;
   Register right = T1;
   Register result = T2;
   Register overflow = T3;
   Label error, done;
@@ skipping 27 matching lines @@
 
   __ b(&done);
   __ Bind(&error);
   __ mov(V0, ZR);
   __ Bind(&done);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(SubOverflow_detect, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Mtc1Mfc1, assembler) {
   __ mtc1(ZR, F0);
   __ mtc1(ZR, F1);
   __ mfc1(V0, F0);
   __ mfc1(V1, F1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Mtc1Mfc1, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Addd, assembler) {
   __ LoadImmediate(D0, 1.0);
   __ LoadImmediate(D1, 2.0);
   __ addd(D0, D0, D1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Addd, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(3.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Movd, assembler) {
   __ LoadImmediate(D1, 1.0);
   __ movd(D0, D1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Movd, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(1.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Sdc1Ldc1, assembler) {
   __ AddImmediate(SP, -8 * kWordSize);
   __ LoadImmediate(T1, ~(8 - 1));
   __ and_(T0, SP, T1);  // Need 8 byte alignment.
   __ LoadImmediate(D1, 1.0);
   __ sdc1(D1, Address(T0));
   __ ldc1(D0, Address(T0));
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Sdc1Ldc1, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(1.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Addd_NaN, assembler) {
   __ LoadImmediate(D0, 1.0);
   // Double non-signaling NaN is 0x7FF8000000000000.
   __ LoadImmediate(T0, 0x7FF80000);
   __ mtc1(ZR, F2);  // Load upper bits of NaN.
   __ mtc1(T0, F3);  // Load lower bits of NaN.
   __ addd(D0, D0, D1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Addd_NaN, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_EQ(isnan(res), true);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Addd_Inf, assembler) {
   __ LoadImmediate(D0, 1.0);
   __ LoadImmediate(T0, 0x7FF00000);  // +inf
   __ mtc1(ZR, F2);
   __ mtc1(T0, F3);
   __ addd(D0, D0, D1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Addd_Inf, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_EQ(isfinite(res), false);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Subd, assembler) {
   __ LoadImmediate(D0, 2.5);
   __ LoadImmediate(D1, 1.5);
   __ subd(D0, D0, D1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Subd, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(1.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Muld, assembler) {
   __ LoadImmediate(D0, 6.0);
   __ LoadImmediate(D1, 7.0);
   __ muld(D0, D0, D1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Muld, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(42.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Divd, assembler) {
   __ LoadImmediate(D0, 42.0);
   __ LoadImmediate(D1, 7.0);
   __ divd(D0, D0, D1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Divd, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(6.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Sqrtd, assembler) {
   __ LoadImmediate(D1, 36.0);
   __ sqrtd(D0, D1);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Sqrtd, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(6.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CUN, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.0);
   __ LoadImmediate(T0, 0x7FF80000);
   __ mtc1(ZR, F2);
   __ mtc1(T0, F3);
   __ LoadImmediate(V0, 42);
   __ cund(D0, D1);
   __ bc1t(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CUN, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CUN_not_taken, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.0);
   __ LoadImmediate(D1, 42.0);
   __ LoadImmediate(V0, 42);
   __ cund(D0, D1);
   __ bc1t(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CUN_not_taken, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CEq, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.5);
   __ LoadImmediate(D1, 42.5);
   __ LoadImmediate(V0, 42);
   __ ceqd(D0, D1);
   __ bc1t(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CEq, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CEq_not_taken, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.0);
   __ LoadImmediate(D1, 42.5);
   __ LoadImmediate(V0, 42);
   __ ceqd(D0, D1);
   __ bc1t(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CEq_not_taken, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CEq_false, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.0);
   __ LoadImmediate(D1, 42.5);
   __ LoadImmediate(V0, 42);
   __ ceqd(D0, D1);
   __ bc1f(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CEq_false, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CEq_false_not_taken, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.5);
   __ LoadImmediate(D1, 42.5);
   __ LoadImmediate(V0, 42);
   __ ceqd(D0, D1);
   __ bc1f(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CEq_false_not_taken, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1COLT, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.0);
   __ LoadImmediate(D1, 42.5);
   __ LoadImmediate(V0, 42);
   __ coltd(D0, D1);
   __ bc1t(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1COLT, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1COLT_not_taken, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.5);
   __ LoadImmediate(D1, 42.0);
   __ LoadImmediate(V0, 42);
   __ coltd(D0, D1);
   __ bc1t(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1COLT_not_taken, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1COLE, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.0);
   __ LoadImmediate(D1, 42.0);
   __ LoadImmediate(V0, 42);
   __ coled(D0, D1);
   __ bc1t(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1COLE, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1COLE_not_taken, assembler) {
   Label is_true;
 
   __ LoadImmediate(D0, 42.5);
   __ LoadImmediate(D1, 42.0);
   __ LoadImmediate(V0, 42);
   __ coled(D0, D1);
   __ bc1t(&is_true);
   __ mov(V0, ZR);
   __ Bind(&is_true);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1COLE_not_taken, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CvtDW, assembler) {
   __ LoadImmediate(T0, 42);
   __ mtc1(T0, F2);
   __ cvtdw(D0, F2);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CvtDW, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(42.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CvtDW_neg, assembler) {
   __ LoadImmediate(T0, -42);
   __ mtc1(T0, F2);
   __ cvtdw(D0, F2);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CvtDW_neg, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(-42.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CvtDL, assembler) {
   if (TargetCPUFeatures::mips_version() == MIPS32r2) {
     __ LoadImmediate(T0, 0x1);
     __ mtc1(ZR, F2);
     __ mtc1(T0, F3);  // D0 <- 0x100000000 = 4294967296
     __ cvtdl(D0, D1);
   } else {
     __ LoadImmediate(D0, 4294967296.0);
   }
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CvtDL, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(4294967296.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CvtDL_neg, assembler) {
   if (TargetCPUFeatures::mips_version() == MIPS32r2) {
     __ LoadImmediate(T0, 0xffffffff);
     __ mtc1(T0, F2);
     __ mtc1(T0, F3);  // D0 <- 0xffffffffffffffff = -1
     __ cvtdl(D0, D1);
   } else {
     __ LoadImmediate(D0, -1.0);
   }
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CvtDL_neg, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(-1.0, res, 0.001);
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CvtWD, assembler) {
   __ LoadImmediate(D1, 42.0);
   __ cvtwd(F0, D1);
   __ mfc1(V0, F0);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CvtWD, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CvtWD_neg, assembler) {
   __ LoadImmediate(D1, -42.0);
   __ cvtwd(F0, D1);
   __ mfc1(V0, F0);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CvtWD_neg, test) {
-  typedef int (*SimpleCode)();
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   EXPECT_EQ(-42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CvtSD, assembler) {
   __ LoadImmediate(D2, -42.42);
   __ cvtsd(F2, D2);
   __ cvtds(D0, F2);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1CvtSD, test) {
-  typedef double (*SimpleCode)();
+  typedef double (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry());
   EXPECT_FLOAT_EQ(-42.42, res, 0.001);
 }
 
 
 // Called from assembler_test.cc.
 // RA: return address.
 // A0: context.
 // A1: value.
 // A2: growable array.
 ASSEMBLER_TEST_GENERATE(StoreIntoObject, assembler) {
   __ addiu(SP, SP, Immediate(-2 * kWordSize));
   __ sw(CTX, Address(SP, 1 * kWordSize));
   __ sw(RA, Address(SP, 0 * kWordSize));
 
   __ mov(CTX, A0);
   __ StoreIntoObject(A2,
                      FieldAddress(A2, GrowableObjectArray::data_offset()),
                      A1);
   __ lw(RA, Address(SP, 0 * kWordSize));
   __ lw(CTX, Address(SP, 1 * kWordSize));
   __ addiu(SP, SP, Immediate(2 * kWordSize));
   __ Ret();
 }
 
 }  // namespace dart
 
 #endif  // defined TARGET_ARCH_MIPS