runtime/vm/bitmap_test.cc - Issue 2974233002: VM: Re-format to use at most one newline between functions

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Unified Diff: runtime/vm/bitmap_test.cc

Issue 2974233002: VM: Re-format to use at most one newline between functions (Closed)

Patch Set: Rebase and merge Created 3 years, 5 months ago

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Index: runtime/vm/bitmap_test.cc

diff --git a/runtime/vm/bitmap_test.cc b/runtime/vm/bitmap_test.cc

index 95fcd68e32711f08d904f299e3f9a148d17f695d..98a5e1746a4feeb7f34f0b185c7dd5db34756b65 100644

--- a/runtime/vm/bitmap_test.cc

+++ b/runtime/vm/bitmap_test.cc

@@ -2,8 +2,8 @@

// BSD-style license that can be found in the LICENSE file.

-#include "platform/assert.h"

#include "vm/bitmap.h"

+#include "platform/assert.h"

#include "vm/object.h"

#include "vm/unit_test.h"

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