Inline instance object hash code into object header on 64 bit.

runtime/vm/assembler_arm64_test.cc

 // Copyright (c) 2013, the Dart project authors.  Please see the AUTHORS file
 // for details. All rights reserved. Use of this source code is governed by a
 // BSD-style license that can be found in the LICENSE file.
 
 #include "vm/globals.h"
 #if defined(TARGET_ARCH_ARM64)
 
 #include "vm/assembler.h"
 #include "vm/cpu.h"
 #include "vm/os.h"
@@ skipping 589 matching lines @@
 }
 
 
 ASSEMBLER_TEST_RUN(FailedSemaphore, test) {
   EXPECT(test != NULL);
   typedef int (*FailedSemaphore)() DART_UNUSED;
   EXPECT_EQ(41, EXECUTE_TEST_CODE_INT64(FailedSemaphore, test->entry()));
 }
 
 
+ASSEMBLER_TEST_GENERATE(Semaphore32, assembler) {
+  __ SetupDartSP();
+  __ movz(R0, Immediate(40), 0);
+  __ add(R0, R0, Operand(R0, LSL, 32));
+  __ Push(R0);
+
+  __ movz(R0, Immediate(40), 0);
+  __ movz(R1, Immediate(42), 0);
+
+  Label retry;
+  __ Bind(&retry);
+  __ ldxr(R0, SP, kWord);
+  // 32 bit operation should ignore the high word of R0 that was pushed on the
+  // stack.
+  __ stxr(TMP, R1, SP, kWord);  // IP == 0, success
+  __ cmp(TMP, Operand(0));
+  __ b(&retry, NE);  // NE if context switch occurred between ldrex and strex.
+  __ Pop(R0);        // 42 + 42 * 2**32
+  __ RestoreCSP();
+  __ ret();
+}
+
+
+ASSEMBLER_TEST_RUN(Semaphore32, test) {
+  EXPECT(test != NULL);
+  typedef int (*Semaphore32)() DART_UNUSED;
+  // Lower word has been atomically switched from 40 to 42k, whereas upper word
+  // is unchanged at 40.
+  EXPECT_EQ(42 + (40l << 32),
+            EXECUTE_TEST_CODE_INT64(Semaphore32, test->entry()));
+}
+
+
+ASSEMBLER_TEST_GENERATE(FailedSemaphore32, assembler) {
+  __ SetupDartSP();
+  __ movz(R0, Immediate(40), 0);
+  __ add(R0, R0, Operand(R0, LSL, 32));
+  __ Push(R0);
+
+  __ movz(R0, Immediate(40), 0);
+  __ movz(R1, Immediate(42), 0);
+
+  __ ldxr(R0, SP, kWord);
+  __ clrex();                   // Simulate a context switch.
+  __ stxr(TMP, R1, SP, kWord);  // IP == 1, failure
+  __ Pop(R0);                   // 40
+  __ add(R0, R0, Operand(TMP));
+  __ RestoreCSP();
+  __ ret();
+}
+
+
+ASSEMBLER_TEST_RUN(FailedSemaphore32, test) {
+  EXPECT(test != NULL);
+  typedef int (*FailedSemaphore32)() DART_UNUSED;
+  // Lower word has had the failure code (1) added to it.  Upper word is
+  // unchanged at 40.
+  EXPECT_EQ(41 + (40l << 32),
+            EXECUTE_TEST_CODE_INT64(FailedSemaphore32, test->entry()));
+}
+
+
 // Logical register operations.
 ASSEMBLER_TEST_GENERATE(AndRegs, assembler) {
   __ movz(R1, Immediate(43), 0);
   __ movz(R2, Immediate(42), 0);
   __ and_(R0, R1, Operand(R2));
   __ ret();
 }
 
 
 ASSEMBLER_TEST_RUN(AndRegs, test) {
@@ skipping 3172 matching lines @@
   __ Pop(LR);
   __ Pop(THR);
   __ Pop(CODE_REG);
   __ RestoreCSP();
   __ ret();
 }
 
 }  // namespace dart
 
 #endif  // defined(TARGET_ARCH_ARM64)