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1 // Copyright (c) 2013, the Dart project authors. Please see the AUTHORS file | |
2 // for details. All rights reserved. Use of this source code is governed by a | |
3 // BSD-style license that can be found in the LICENSE file. | |
4 | |
5 #include "vm/globals.h" | |
6 #if defined(TARGET_ARCH_MIPS) | |
7 | |
8 #include "vm/assembler.h" | |
9 #include "vm/cpu.h" | |
10 #include "vm/os.h" | |
11 #include "vm/unit_test.h" | |
12 #include "vm/virtual_memory.h" | |
13 | |
14 namespace dart { | |
15 | |
16 #define __ assembler-> | |
17 | |
18 ASSEMBLER_TEST_GENERATE(Simple, assembler) { | |
19 __ LoadImmediate(V0, 42); | |
20 __ jr(RA); | |
21 } | |
22 | |
23 | |
24 ASSEMBLER_TEST_RUN(Simple, test) { | |
25 typedef int (*SimpleCode)() DART_UNUSED; | |
26 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
27 } | |
28 | |
29 | |
30 ASSEMBLER_TEST_GENERATE(Addiu, assembler) { | |
31 __ addiu(V0, ZR, Immediate(42)); | |
32 __ jr(RA); | |
33 } | |
34 | |
35 | |
36 ASSEMBLER_TEST_RUN(Addiu, test) { | |
37 typedef int (*SimpleCode)() DART_UNUSED; | |
38 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
39 } | |
40 | |
41 | |
42 ASSEMBLER_TEST_GENERATE(Addiu_overflow, assembler) { | |
43 __ LoadImmediate(V0, 0x7fffffff); | |
44 __ addiu(V0, V0, Immediate(1)); // V0 is modified on overflow. | |
45 __ jr(RA); | |
46 } | |
47 | |
48 | |
49 ASSEMBLER_TEST_RUN(Addiu_overflow, test) { | |
50 typedef int (*SimpleCode)() DART_UNUSED; | |
51 EXPECT_EQ(static_cast<int32_t>(0x80000000), | |
52 EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
53 } | |
54 | |
55 | |
56 ASSEMBLER_TEST_GENERATE(Addu, assembler) { | |
57 __ addiu(T2, ZR, Immediate(21)); | |
58 __ addiu(T3, ZR, Immediate(21)); | |
59 __ addu(V0, T2, T3); | |
60 __ jr(RA); | |
61 } | |
62 | |
63 | |
64 ASSEMBLER_TEST_RUN(Addu, test) { | |
65 typedef int (*SimpleCode)() DART_UNUSED; | |
66 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
67 } | |
68 | |
69 | |
70 ASSEMBLER_TEST_GENERATE(Addu_overflow, assembler) { | |
71 __ LoadImmediate(T2, 0x7fffffff); | |
72 __ addiu(T3, R0, Immediate(1)); | |
73 __ addu(V0, T2, T3); | |
74 __ jr(RA); | |
75 } | |
76 | |
77 | |
78 ASSEMBLER_TEST_RUN(Addu_overflow, test) { | |
79 typedef int (*SimpleCode)() DART_UNUSED; | |
80 EXPECT_EQ(static_cast<int32_t>(0x80000000), | |
81 EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
82 } | |
83 | |
84 | |
85 ASSEMBLER_TEST_GENERATE(And, assembler) { | |
86 __ addiu(T2, ZR, Immediate(42)); | |
87 __ addiu(T3, ZR, Immediate(2)); | |
88 __ and_(V0, T2, T3); | |
89 __ jr(RA); | |
90 } | |
91 | |
92 | |
93 ASSEMBLER_TEST_RUN(And, test) { | |
94 typedef int (*SimpleCode)() DART_UNUSED; | |
95 EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
96 } | |
97 | |
98 | |
99 ASSEMBLER_TEST_GENERATE(Andi, assembler) { | |
100 __ addiu(T1, ZR, Immediate(42)); | |
101 __ andi(V0, T1, Immediate(2)); | |
102 __ jr(RA); | |
103 } | |
104 | |
105 | |
106 ASSEMBLER_TEST_RUN(Andi, test) { | |
107 typedef int (*SimpleCode)() DART_UNUSED; | |
108 EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
109 } | |
110 | |
111 | |
112 ASSEMBLER_TEST_GENERATE(Clo, assembler) { | |
113 __ addiu(T1, ZR, Immediate(-1)); | |
114 __ clo(V0, T1); | |
115 __ jr(RA); | |
116 } | |
117 | |
118 | |
119 ASSEMBLER_TEST_RUN(Clo, test) { | |
120 typedef int (*SimpleCode)() DART_UNUSED; | |
121 EXPECT_EQ(32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
122 } | |
123 | |
124 | |
125 ASSEMBLER_TEST_GENERATE(Clz, assembler) { | |
126 __ addiu(T1, ZR, Immediate(0x7fff)); | |
127 __ clz(V0, T1); | |
128 __ jr(RA); | |
129 } | |
130 | |
131 | |
132 ASSEMBLER_TEST_RUN(Clz, test) { | |
133 typedef int (*SimpleCode)() DART_UNUSED; | |
134 EXPECT_EQ(17, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
135 } | |
136 | |
137 | |
138 ASSEMBLER_TEST_GENERATE(MtloMflo, assembler) { | |
139 __ LoadImmediate(T0, 42); | |
140 __ mtlo(T0); | |
141 __ mflo(V0); | |
142 __ jr(RA); | |
143 } | |
144 | |
145 | |
146 ASSEMBLER_TEST_RUN(MtloMflo, test) { | |
147 typedef int (*SimpleCode)() DART_UNUSED; | |
148 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
149 } | |
150 | |
151 | |
152 ASSEMBLER_TEST_GENERATE(MthiMfhi, assembler) { | |
153 __ LoadImmediate(T0, 42); | |
154 __ mthi(T0); | |
155 __ mfhi(V0); | |
156 __ jr(RA); | |
157 } | |
158 | |
159 | |
160 ASSEMBLER_TEST_RUN(MthiMfhi, test) { | |
161 typedef int (*SimpleCode)() DART_UNUSED; | |
162 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
163 } | |
164 | |
165 | |
166 ASSEMBLER_TEST_GENERATE(Divu, assembler) { | |
167 __ addiu(T1, ZR, Immediate(27)); | |
168 __ addiu(T2, ZR, Immediate(9)); | |
169 __ divu(T1, T2); | |
170 __ mflo(V0); | |
171 __ jr(RA); | |
172 } | |
173 | |
174 | |
175 ASSEMBLER_TEST_RUN(Divu, test) { | |
176 typedef int (*SimpleCode)() DART_UNUSED; | |
177 EXPECT_EQ(3, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
178 } | |
179 | |
180 | |
181 ASSEMBLER_TEST_GENERATE(Div, assembler) { | |
182 __ addiu(T1, ZR, Immediate(27)); | |
183 __ addiu(T2, ZR, Immediate(9)); | |
184 __ div(T1, T2); | |
185 __ mflo(V0); | |
186 __ jr(RA); | |
187 } | |
188 | |
189 | |
190 ASSEMBLER_TEST_RUN(Div, test) { | |
191 typedef int (*SimpleCode)() DART_UNUSED; | |
192 EXPECT_EQ(3, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
193 } | |
194 | |
195 | |
196 ASSEMBLER_TEST_GENERATE(Divu_corner, assembler) { | |
197 __ LoadImmediate(T1, 0x80000000); | |
198 __ LoadImmediate(T2, 0xffffffff); | |
199 __ divu(T1, T2); | |
200 __ mflo(V0); | |
201 __ jr(RA); | |
202 } | |
203 | |
204 | |
205 ASSEMBLER_TEST_RUN(Divu_corner, test) { | |
206 typedef int (*SimpleCode)() DART_UNUSED; | |
207 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
208 } | |
209 | |
210 | |
211 ASSEMBLER_TEST_GENERATE(Div_corner, assembler) { | |
212 __ LoadImmediate(T1, 0x80000000); | |
213 __ LoadImmediate(T2, 0xffffffff); | |
214 __ div(T1, T2); | |
215 __ mflo(V0); | |
216 __ jr(RA); | |
217 } | |
218 | |
219 | |
220 ASSEMBLER_TEST_RUN(Div_corner, test) { | |
221 typedef int (*SimpleCode)() DART_UNUSED; | |
222 EXPECT_EQ(static_cast<int32_t>(0x80000000), | |
223 EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
224 } | |
225 | |
226 | |
227 ASSEMBLER_TEST_GENERATE(Lb, assembler) { | |
228 __ addiu(SP, SP, Immediate(-kWordSize * 30)); | |
229 __ LoadImmediate(T1, 0xff); | |
230 __ sb(T1, Address(SP)); | |
231 __ lb(V0, Address(SP)); | |
232 __ addiu(SP, SP, Immediate(kWordSize * 30)); | |
233 __ jr(RA); | |
234 } | |
235 | |
236 | |
237 ASSEMBLER_TEST_RUN(Lb, test) { | |
238 typedef int (*SimpleCode)() DART_UNUSED; | |
239 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
240 } | |
241 | |
242 | |
243 ASSEMBLER_TEST_GENERATE(Lb_offset, assembler) { | |
244 __ addiu(SP, SP, Immediate(-kWordSize * 30)); | |
245 __ LoadImmediate(T1, 0xff); | |
246 __ sb(T1, Address(SP, 1)); | |
247 __ lb(V0, Address(SP, 1)); | |
248 __ addiu(SP, SP, Immediate(kWordSize * 30)); | |
249 __ jr(RA); | |
250 } | |
251 | |
252 | |
253 ASSEMBLER_TEST_RUN(Lb_offset, test) { | |
254 typedef int (*SimpleCode)() DART_UNUSED; | |
255 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
256 } | |
257 | |
258 | |
259 ASSEMBLER_TEST_GENERATE(Lbu, assembler) { | |
260 __ addiu(SP, SP, Immediate(-kWordSize * 30)); | |
261 __ LoadImmediate(T1, 0xff); | |
262 __ sb(T1, Address(SP)); | |
263 __ lbu(V0, Address(SP)); | |
264 __ addiu(SP, SP, Immediate(kWordSize * 30)); | |
265 __ jr(RA); | |
266 } | |
267 | |
268 | |
269 ASSEMBLER_TEST_RUN(Lbu, test) { | |
270 typedef int (*SimpleCode)() DART_UNUSED; | |
271 EXPECT_EQ(255, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
272 } | |
273 | |
274 | |
275 ASSEMBLER_TEST_GENERATE(Lh, assembler) { | |
276 __ addiu(SP, SP, Immediate(-kWordSize * 30)); | |
277 __ LoadImmediate(T1, 0xffff); | |
278 __ sh(T1, Address(SP)); | |
279 __ lh(V0, Address(SP)); | |
280 __ addiu(SP, SP, Immediate(kWordSize * 30)); | |
281 __ jr(RA); | |
282 } | |
283 | |
284 | |
285 ASSEMBLER_TEST_RUN(Lh, test) { | |
286 typedef int (*SimpleCode)() DART_UNUSED; | |
287 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
288 } | |
289 | |
290 | |
291 ASSEMBLER_TEST_GENERATE(Lhu, assembler) { | |
292 __ addiu(SP, SP, Immediate(-kWordSize * 30)); | |
293 __ LoadImmediate(T1, 0xffff); | |
294 __ sh(T1, Address(SP)); | |
295 __ lhu(V0, Address(SP)); | |
296 __ addiu(SP, SP, Immediate(kWordSize * 30)); | |
297 __ jr(RA); | |
298 } | |
299 | |
300 | |
301 ASSEMBLER_TEST_RUN(Lhu, test) { | |
302 typedef int (*SimpleCode)() DART_UNUSED; | |
303 EXPECT_EQ(65535, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
304 } | |
305 | |
306 | |
307 ASSEMBLER_TEST_GENERATE(Lw, assembler) { | |
308 __ addiu(SP, SP, Immediate(-kWordSize * 30)); | |
309 __ LoadImmediate(T1, -1); | |
310 __ sw(T1, Address(SP)); | |
311 __ lw(V0, Address(SP)); | |
312 __ addiu(SP, SP, Immediate(kWordSize * 30)); | |
313 __ jr(RA); | |
314 } | |
315 | |
316 | |
317 ASSEMBLER_TEST_RUN(Lw, test) { | |
318 typedef int (*SimpleCode)() DART_UNUSED; | |
319 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
320 } | |
321 | |
322 | |
323 ASSEMBLER_TEST_GENERATE(LoadHalfWordUnaligned, assembler) { | |
324 __ LoadHalfWordUnaligned(V0, A0, TMP); | |
325 __ jr(RA); | |
326 } | |
327 | |
328 | |
329 ASSEMBLER_TEST_RUN(LoadHalfWordUnaligned, test) { | |
330 EXPECT(test != NULL); | |
331 typedef intptr_t (*LoadHalfWordUnaligned)(intptr_t) DART_UNUSED; | |
332 uint8_t buffer[4] = { | |
333 0x89, 0xAB, 0xCD, 0xEF, | |
334 }; | |
335 | |
336 EXPECT_EQ( | |
337 static_cast<int16_t>(static_cast<uint16_t>(0xAB89)), | |
338 EXECUTE_TEST_CODE_INTPTR_INTPTR(LoadHalfWordUnaligned, test->entry(), | |
339 reinterpret_cast<intptr_t>(&buffer[0]))); | |
340 EXPECT_EQ( | |
341 static_cast<int16_t>(static_cast<uint16_t>(0xCDAB)), | |
342 EXECUTE_TEST_CODE_INTPTR_INTPTR(LoadHalfWordUnaligned, test->entry(), | |
343 reinterpret_cast<intptr_t>(&buffer[1]))); | |
344 } | |
345 | |
346 | |
347 ASSEMBLER_TEST_GENERATE(LoadHalfWordUnsignedUnaligned, assembler) { | |
348 __ LoadHalfWordUnsignedUnaligned(V0, A0, TMP); | |
349 __ jr(RA); | |
350 } | |
351 | |
352 | |
353 ASSEMBLER_TEST_RUN(LoadHalfWordUnsignedUnaligned, test) { | |
354 EXPECT(test != NULL); | |
355 typedef intptr_t (*LoadHalfWordUnsignedUnaligned)(intptr_t) DART_UNUSED; | |
356 uint8_t buffer[4] = { | |
357 0x89, 0xAB, 0xCD, 0xEF, | |
358 }; | |
359 | |
360 EXPECT_EQ(0xAB89, EXECUTE_TEST_CODE_INTPTR_INTPTR( | |
361 LoadHalfWordUnsignedUnaligned, test->entry(), | |
362 reinterpret_cast<intptr_t>(&buffer[0]))); | |
363 EXPECT_EQ(0xCDAB, EXECUTE_TEST_CODE_INTPTR_INTPTR( | |
364 LoadHalfWordUnsignedUnaligned, test->entry(), | |
365 reinterpret_cast<intptr_t>(&buffer[1]))); | |
366 } | |
367 | |
368 | |
369 ASSEMBLER_TEST_GENERATE(StoreHalfWordUnaligned, assembler) { | |
370 __ LoadImmediate(A1, 0xABCD); | |
371 __ StoreWordUnaligned(A1, A0, TMP); | |
372 __ mov(V0, A1); | |
373 __ jr(RA); | |
374 } | |
375 | |
376 | |
377 ASSEMBLER_TEST_RUN(StoreHalfWordUnaligned, test) { | |
378 EXPECT(test != NULL); | |
379 typedef intptr_t (*StoreHalfWordUnaligned)(intptr_t) DART_UNUSED; | |
380 uint8_t buffer[4] = { | |
381 0, 0, 0, 0, | |
382 }; | |
383 | |
384 EXPECT_EQ(0xABCD, EXECUTE_TEST_CODE_INTPTR_INTPTR( | |
385 StoreHalfWordUnaligned, test->entry(), | |
386 reinterpret_cast<intptr_t>(&buffer[0]))); | |
387 EXPECT_EQ(0xCD, buffer[0]); | |
388 EXPECT_EQ(0xAB, buffer[1]); | |
389 EXPECT_EQ(0, buffer[2]); | |
390 | |
391 EXPECT_EQ(0xABCD, EXECUTE_TEST_CODE_INTPTR_INTPTR( | |
392 StoreHalfWordUnaligned, test->entry(), | |
393 reinterpret_cast<intptr_t>(&buffer[1]))); | |
394 EXPECT_EQ(0xCD, buffer[1]); | |
395 EXPECT_EQ(0xAB, buffer[2]); | |
396 EXPECT_EQ(0, buffer[3]); | |
397 } | |
398 | |
399 | |
400 ASSEMBLER_TEST_GENERATE(LoadWordUnaligned, assembler) { | |
401 __ LoadWordUnaligned(V0, A0, TMP); | |
402 __ jr(RA); | |
403 } | |
404 | |
405 | |
406 ASSEMBLER_TEST_RUN(LoadWordUnaligned, test) { | |
407 EXPECT(test != NULL); | |
408 typedef intptr_t (*LoadWordUnaligned)(intptr_t) DART_UNUSED; | |
409 uint8_t buffer[8] = {0x12, 0x34, 0x56, 0x78, 0x9A, 0xBC, 0xDE, 0xF0}; | |
410 | |
411 EXPECT_EQ( | |
412 static_cast<intptr_t>(0x78563412), | |
413 EXECUTE_TEST_CODE_INTPTR_INTPTR(LoadWordUnaligned, test->entry(), | |
414 reinterpret_cast<intptr_t>(&buffer[0]))); | |
415 EXPECT_EQ( | |
416 static_cast<intptr_t>(0x9A785634), | |
417 EXECUTE_TEST_CODE_INTPTR_INTPTR(LoadWordUnaligned, test->entry(), | |
418 reinterpret_cast<intptr_t>(&buffer[1]))); | |
419 EXPECT_EQ( | |
420 static_cast<intptr_t>(0xBC9A7856), | |
421 EXECUTE_TEST_CODE_INTPTR_INTPTR(LoadWordUnaligned, test->entry(), | |
422 reinterpret_cast<intptr_t>(&buffer[2]))); | |
423 EXPECT_EQ( | |
424 static_cast<intptr_t>(0xDEBC9A78), | |
425 EXECUTE_TEST_CODE_INTPTR_INTPTR(LoadWordUnaligned, test->entry(), | |
426 reinterpret_cast<intptr_t>(&buffer[3]))); | |
427 } | |
428 | |
429 | |
430 ASSEMBLER_TEST_GENERATE(StoreWordUnaligned, assembler) { | |
431 __ LoadImmediate(A1, 0x12345678); | |
432 __ StoreWordUnaligned(A1, A0, TMP); | |
433 __ mov(V0, A1); | |
434 __ jr(RA); | |
435 } | |
436 | |
437 | |
438 ASSEMBLER_TEST_RUN(StoreWordUnaligned, test) { | |
439 EXPECT(test != NULL); | |
440 typedef intptr_t (*StoreWordUnaligned)(intptr_t) DART_UNUSED; | |
441 uint8_t buffer[8] = {0, 0, 0, 0, 0, 0, 0, 0}; | |
442 | |
443 EXPECT_EQ(0x12345678, EXECUTE_TEST_CODE_INTPTR_INTPTR( | |
444 StoreWordUnaligned, test->entry(), | |
445 reinterpret_cast<intptr_t>(&buffer[0]))); | |
446 EXPECT_EQ(0x78, buffer[0]); | |
447 EXPECT_EQ(0x56, buffer[1]); | |
448 EXPECT_EQ(0x34, buffer[2]); | |
449 EXPECT_EQ(0x12, buffer[3]); | |
450 | |
451 EXPECT_EQ(0x12345678, EXECUTE_TEST_CODE_INTPTR_INTPTR( | |
452 StoreWordUnaligned, test->entry(), | |
453 reinterpret_cast<intptr_t>(&buffer[1]))); | |
454 EXPECT_EQ(0x78, buffer[1]); | |
455 EXPECT_EQ(0x56, buffer[2]); | |
456 EXPECT_EQ(0x34, buffer[3]); | |
457 EXPECT_EQ(0x12, buffer[4]); | |
458 | |
459 EXPECT_EQ(0x12345678, EXECUTE_TEST_CODE_INTPTR_INTPTR( | |
460 StoreWordUnaligned, test->entry(), | |
461 reinterpret_cast<intptr_t>(&buffer[2]))); | |
462 EXPECT_EQ(0x78, buffer[2]); | |
463 EXPECT_EQ(0x56, buffer[3]); | |
464 EXPECT_EQ(0x34, buffer[4]); | |
465 EXPECT_EQ(0x12, buffer[5]); | |
466 | |
467 EXPECT_EQ(0x12345678, EXECUTE_TEST_CODE_INTPTR_INTPTR( | |
468 StoreWordUnaligned, test->entry(), | |
469 reinterpret_cast<intptr_t>(&buffer[3]))); | |
470 EXPECT_EQ(0x78, buffer[3]); | |
471 EXPECT_EQ(0x56, buffer[4]); | |
472 EXPECT_EQ(0x34, buffer[5]); | |
473 EXPECT_EQ(0x12, buffer[6]); | |
474 } | |
475 | |
476 | |
477 ASSEMBLER_TEST_GENERATE(Lui, assembler) { | |
478 __ lui(V0, Immediate(42)); | |
479 __ jr(RA); | |
480 } | |
481 | |
482 | |
483 ASSEMBLER_TEST_RUN(Lui, test) { | |
484 typedef int (*SimpleCode)() DART_UNUSED; | |
485 EXPECT_EQ(42 << 16, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
486 } | |
487 | |
488 | |
489 ASSEMBLER_TEST_GENERATE(Sll, assembler) { | |
490 __ LoadImmediate(T1, 21); | |
491 __ sll(V0, T1, 1); | |
492 __ jr(RA); | |
493 } | |
494 | |
495 | |
496 ASSEMBLER_TEST_RUN(Sll, test) { | |
497 typedef int (*SimpleCode)() DART_UNUSED; | |
498 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
499 } | |
500 | |
501 | |
502 ASSEMBLER_TEST_GENERATE(Srl, assembler) { | |
503 __ LoadImmediate(T1, 84); | |
504 __ srl(V0, T1, 1); | |
505 __ jr(RA); | |
506 } | |
507 | |
508 | |
509 ASSEMBLER_TEST_RUN(Srl, test) { | |
510 typedef int (*SimpleCode)() DART_UNUSED; | |
511 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
512 } | |
513 | |
514 | |
515 ASSEMBLER_TEST_GENERATE(LShifting, assembler) { | |
516 __ LoadImmediate(T1, 1); | |
517 __ sll(T1, T1, 31); | |
518 __ srl(V0, T1, 31); | |
519 __ jr(RA); | |
520 } | |
521 | |
522 | |
523 ASSEMBLER_TEST_RUN(LShifting, test) { | |
524 typedef int (*SimpleCode)() DART_UNUSED; | |
525 EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
526 } | |
527 | |
528 | |
529 ASSEMBLER_TEST_GENERATE(RShifting, assembler) { | |
530 __ LoadImmediate(T1, 1); | |
531 __ sll(T1, T1, 31); | |
532 __ sra(V0, T1, 31); | |
533 __ jr(RA); | |
534 } | |
535 | |
536 | |
537 ASSEMBLER_TEST_RUN(RShifting, test) { | |
538 typedef int (*SimpleCode)() DART_UNUSED; | |
539 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
540 } | |
541 | |
542 | |
543 ASSEMBLER_TEST_GENERATE(Sllv, assembler) { | |
544 __ LoadImmediate(T1, 21); | |
545 __ LoadImmediate(T2, 1); | |
546 __ sllv(V0, T1, T2); | |
547 __ jr(RA); | |
548 } | |
549 | |
550 | |
551 ASSEMBLER_TEST_RUN(Sllv, test) { | |
552 typedef int (*SimpleCode)() DART_UNUSED; | |
553 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
554 } | |
555 | |
556 | |
557 ASSEMBLER_TEST_GENERATE(Srlv, assembler) { | |
558 __ LoadImmediate(T1, 84); | |
559 __ LoadImmediate(T2, 1); | |
560 __ srlv(V0, T1, T2); | |
561 __ jr(RA); | |
562 } | |
563 | |
564 | |
565 ASSEMBLER_TEST_RUN(Srlv, test) { | |
566 typedef int (*SimpleCode)() DART_UNUSED; | |
567 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
568 } | |
569 | |
570 | |
571 ASSEMBLER_TEST_GENERATE(LShiftingV, assembler) { | |
572 __ LoadImmediate(T1, 1); | |
573 __ LoadImmediate(T2, 31); | |
574 __ sllv(T1, T1, T2); | |
575 __ srlv(V0, T1, T2); | |
576 __ jr(RA); | |
577 } | |
578 | |
579 | |
580 ASSEMBLER_TEST_RUN(LShiftingV, test) { | |
581 typedef int (*SimpleCode)() DART_UNUSED; | |
582 EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
583 } | |
584 | |
585 | |
586 ASSEMBLER_TEST_GENERATE(RShiftingV, assembler) { | |
587 __ LoadImmediate(T1, 1); | |
588 __ LoadImmediate(T2, 31); | |
589 __ sllv(T1, T1, T2); | |
590 __ srav(V0, T1, T2); | |
591 __ jr(RA); | |
592 } | |
593 | |
594 | |
595 ASSEMBLER_TEST_RUN(RShiftingV, test) { | |
596 typedef int (*SimpleCode)() DART_UNUSED; | |
597 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
598 } | |
599 | |
600 | |
601 ASSEMBLER_TEST_GENERATE(Mult_pos, assembler) { | |
602 __ LoadImmediate(T1, 6); | |
603 __ LoadImmediate(T2, 7); | |
604 __ mult(T1, T2); | |
605 __ mflo(V0); | |
606 __ jr(RA); | |
607 } | |
608 | |
609 | |
610 ASSEMBLER_TEST_RUN(Mult_pos, test) { | |
611 typedef int (*SimpleCode)() DART_UNUSED; | |
612 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
613 } | |
614 | |
615 | |
616 ASSEMBLER_TEST_GENERATE(Mult_neg, assembler) { | |
617 __ LoadImmediate(T1, -6); | |
618 __ LoadImmediate(T2, 7); | |
619 __ mult(T1, T2); | |
620 __ mflo(V0); | |
621 __ jr(RA); | |
622 } | |
623 | |
624 | |
625 ASSEMBLER_TEST_RUN(Mult_neg, test) { | |
626 typedef int (*SimpleCode)() DART_UNUSED; | |
627 EXPECT_EQ(-42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
628 } | |
629 | |
630 | |
631 ASSEMBLER_TEST_GENERATE(Mult_neg_hi, assembler) { | |
632 __ LoadImmediate(T1, -6); | |
633 __ LoadImmediate(T2, 7); | |
634 __ mult(T1, T2); | |
635 __ mfhi(V0); | |
636 __ jr(RA); | |
637 } | |
638 | |
639 | |
640 ASSEMBLER_TEST_RUN(Mult_neg_hi, test) { | |
641 typedef int (*SimpleCode)() DART_UNUSED; | |
642 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
643 } | |
644 | |
645 | |
646 ASSEMBLER_TEST_GENERATE(Multu_lo, assembler) { | |
647 __ LoadImmediate(T1, 6); | |
648 __ LoadImmediate(T2, 7); | |
649 __ multu(T1, T2); | |
650 __ mflo(V0); | |
651 __ jr(RA); | |
652 } | |
653 | |
654 | |
655 ASSEMBLER_TEST_RUN(Multu_lo, test) { | |
656 typedef int (*SimpleCode)() DART_UNUSED; | |
657 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
658 } | |
659 | |
660 | |
661 ASSEMBLER_TEST_GENERATE(Multu_hi, assembler) { | |
662 __ LoadImmediate(T1, -1); | |
663 __ LoadImmediate(T2, -1); | |
664 __ multu(T1, T2); | |
665 __ mfhi(V0); | |
666 __ jr(RA); | |
667 } | |
668 | |
669 | |
670 ASSEMBLER_TEST_RUN(Multu_hi, test) { | |
671 typedef int (*SimpleCode)() DART_UNUSED; | |
672 EXPECT_EQ(-2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
673 } | |
674 | |
675 | |
676 ASSEMBLER_TEST_GENERATE(Madd_neg, assembler) { | |
677 __ LoadImmediate(T1, -6); | |
678 __ LoadImmediate(T2, 7); | |
679 __ mult(T1, T2); | |
680 __ madd(T1, T2); | |
681 __ mflo(V0); | |
682 __ mfhi(V1); | |
683 __ jr(RA); | |
684 } | |
685 | |
686 | |
687 ASSEMBLER_TEST_RUN(Madd_neg, test) { | |
688 typedef int (*SimpleCode)() DART_UNUSED; | |
689 EXPECT_EQ(-84, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
690 } | |
691 | |
692 | |
693 ASSEMBLER_TEST_GENERATE(Subu, assembler) { | |
694 __ LoadImmediate(T1, 737); | |
695 __ LoadImmediate(T2, 695); | |
696 __ subu(V0, T1, T2); | |
697 __ jr(RA); | |
698 } | |
699 | |
700 | |
701 ASSEMBLER_TEST_RUN(Subu, test) { | |
702 typedef int (*SimpleCode)() DART_UNUSED; | |
703 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
704 } | |
705 | |
706 | |
707 ASSEMBLER_TEST_GENERATE(Or, assembler) { | |
708 __ LoadImmediate(T1, 34); | |
709 __ LoadImmediate(T2, 8); | |
710 __ or_(V0, T1, T2); | |
711 __ jr(RA); | |
712 } | |
713 | |
714 | |
715 ASSEMBLER_TEST_RUN(Or, test) { | |
716 typedef int (*SimpleCode)() DART_UNUSED; | |
717 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
718 } | |
719 | |
720 | |
721 ASSEMBLER_TEST_GENERATE(Nor, assembler) { | |
722 __ LoadImmediate(T1, -47); | |
723 __ LoadImmediate(T2, -60); | |
724 __ nor(V0, T1, T2); | |
725 __ jr(RA); | |
726 } | |
727 | |
728 | |
729 ASSEMBLER_TEST_RUN(Nor, test) { | |
730 typedef int (*SimpleCode)() DART_UNUSED; | |
731 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
732 } | |
733 | |
734 | |
735 ASSEMBLER_TEST_GENERATE(Xor, assembler) { | |
736 __ LoadImmediate(T1, 51); | |
737 __ LoadImmediate(T2, 25); | |
738 __ xor_(V0, T1, T2); | |
739 __ jr(RA); | |
740 } | |
741 | |
742 | |
743 ASSEMBLER_TEST_RUN(Xor, test) { | |
744 typedef int (*SimpleCode)() DART_UNUSED; | |
745 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
746 } | |
747 | |
748 | |
749 ASSEMBLER_TEST_GENERATE(Xori, assembler) { | |
750 __ LoadImmediate(T0, 51); | |
751 __ xori(V0, T0, Immediate(25)); | |
752 __ jr(RA); | |
753 } | |
754 | |
755 | |
756 ASSEMBLER_TEST_RUN(Xori, test) { | |
757 typedef int (*SimpleCode)() DART_UNUSED; | |
758 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
759 } | |
760 | |
761 | |
762 ASSEMBLER_TEST_GENERATE(Slt, assembler) { | |
763 __ LoadImmediate(T1, -1); | |
764 __ LoadImmediate(T2, 0); | |
765 __ slt(V0, T1, T2); | |
766 __ jr(RA); | |
767 } | |
768 | |
769 | |
770 ASSEMBLER_TEST_RUN(Slt, test) { | |
771 typedef int (*SimpleCode)() DART_UNUSED; | |
772 EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
773 } | |
774 | |
775 | |
776 ASSEMBLER_TEST_GENERATE(Sltu, assembler) { | |
777 __ LoadImmediate(T1, -1); | |
778 __ LoadImmediate(T2, 0); | |
779 __ sltu(V0, T1, T2); // 0xffffffffUL < 0 -> 0. | |
780 __ jr(RA); | |
781 } | |
782 | |
783 | |
784 ASSEMBLER_TEST_RUN(Sltu, test) { | |
785 typedef int (*SimpleCode)() DART_UNUSED; | |
786 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
787 } | |
788 | |
789 | |
790 ASSEMBLER_TEST_GENERATE(Slti, assembler) { | |
791 __ LoadImmediate(T1, -2); | |
792 __ slti(A0, T1, Immediate(-1)); // -2 < -1 -> 1. | |
793 __ slti(A1, T1, Immediate(0)); // -2 < 0 -> 1. | |
794 __ and_(V0, A0, A1); | |
795 __ jr(RA); | |
796 } | |
797 | |
798 | |
799 ASSEMBLER_TEST_RUN(Slti, test) { | |
800 typedef int (*SimpleCode)() DART_UNUSED; | |
801 EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
802 } | |
803 | |
804 | |
805 ASSEMBLER_TEST_GENERATE(Sltiu, assembler) { | |
806 __ LoadImmediate(T1, -1); | |
807 __ LoadImmediate(T2, 0x10000); | |
808 __ sltiu(A0, T1, Immediate(-2)); // 0xffffffffUL < 0xfffffffeUL -> 0. | |
809 __ sltiu(A1, T1, Immediate(0)); // 0xffffffffUL < 0 -> 0. | |
810 __ sltiu(A2, T2, Immediate(-2)); // 0x10000UL < 0xfffffffeUL -> 1. | |
811 __ addiu(A2, A2, Immediate(-1)); | |
812 __ or_(V0, A0, A1); | |
813 __ or_(V0, V0, A2); | |
814 __ jr(RA); | |
815 } | |
816 | |
817 | |
818 ASSEMBLER_TEST_RUN(Sltiu, test) { | |
819 typedef int (*SimpleCode)() DART_UNUSED; | |
820 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
821 } | |
822 | |
823 | |
824 ASSEMBLER_TEST_GENERATE(Movz, assembler) { | |
825 __ LoadImmediate(T1, 42); | |
826 __ LoadImmediate(T2, 23); | |
827 __ slt(T3, T1, T2); | |
828 __ movz(V0, T1, T3); | |
829 __ jr(RA); | |
830 } | |
831 | |
832 | |
833 ASSEMBLER_TEST_RUN(Movz, test) { | |
834 typedef int (*SimpleCode)() DART_UNUSED; | |
835 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
836 } | |
837 | |
838 | |
839 ASSEMBLER_TEST_GENERATE(Movn, assembler) { | |
840 __ LoadImmediate(T1, 42); | |
841 __ LoadImmediate(T2, 23); | |
842 __ slt(T3, T2, T1); | |
843 __ movn(V0, T1, T3); | |
844 __ jr(RA); | |
845 } | |
846 | |
847 | |
848 ASSEMBLER_TEST_RUN(Movn, test) { | |
849 typedef int (*SimpleCode)() DART_UNUSED; | |
850 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
851 } | |
852 | |
853 | |
854 ASSEMBLER_TEST_GENERATE(Jr_delay, assembler) { | |
855 __ jr(RA); | |
856 __ delay_slot()->ori(V0, ZR, Immediate(42)); | |
857 } | |
858 | |
859 | |
860 ASSEMBLER_TEST_RUN(Jr_delay, test) { | |
861 typedef int (*SimpleCode)() DART_UNUSED; | |
862 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
863 } | |
864 | |
865 | |
866 ASSEMBLER_TEST_GENERATE(Beq_backward, assembler) { | |
867 Label l; | |
868 | |
869 __ LoadImmediate(T1, 0); | |
870 __ LoadImmediate(T2, 1); | |
871 __ Bind(&l); | |
872 __ addiu(T1, T1, Immediate(1)); | |
873 __ beq(T1, T2, &l); | |
874 __ ori(V0, T1, Immediate(0)); | |
875 __ jr(RA); | |
876 } | |
877 | |
878 | |
879 ASSEMBLER_TEST_RUN(Beq_backward, test) { | |
880 typedef int (*SimpleCode)() DART_UNUSED; | |
881 EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
882 } | |
883 | |
884 | |
885 ASSEMBLER_TEST_GENERATE(Beq_backward_far, assembler) { | |
886 Label l; | |
887 | |
888 __ set_use_far_branches(true); | |
889 | |
890 __ LoadImmediate(T1, 0); | |
891 __ LoadImmediate(T2, 1); | |
892 __ Bind(&l); | |
893 __ addiu(T1, T1, Immediate(1)); | |
894 __ beq(T1, T2, &l); | |
895 __ ori(V0, T1, Immediate(0)); | |
896 __ jr(RA); | |
897 } | |
898 | |
899 | |
900 ASSEMBLER_TEST_RUN(Beq_backward_far, test) { | |
901 typedef int (*SimpleCode)() DART_UNUSED; | |
902 EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
903 } | |
904 | |
905 | |
906 ASSEMBLER_TEST_GENERATE(Beq_backward_delay, assembler) { | |
907 Label l; | |
908 | |
909 __ LoadImmediate(T1, 0); | |
910 __ LoadImmediate(T2, 1); | |
911 __ Bind(&l); | |
912 __ addiu(T1, T1, Immediate(1)); | |
913 __ beq(T1, T2, &l); | |
914 __ delay_slot()->addiu(T1, T1, Immediate(1)); | |
915 __ ori(V0, T1, Immediate(0)); | |
916 __ jr(RA); | |
917 } | |
918 | |
919 | |
920 ASSEMBLER_TEST_RUN(Beq_backward_delay, test) { | |
921 typedef int (*SimpleCode)() DART_UNUSED; | |
922 EXPECT_EQ(4, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
923 } | |
924 | |
925 | |
926 ASSEMBLER_TEST_GENERATE(Beq_forward_taken, assembler) { | |
927 Label l; | |
928 | |
929 __ LoadImmediate(T5, 1); | |
930 __ LoadImmediate(T6, 1); | |
931 | |
932 __ LoadImmediate(V0, 42); | |
933 __ beq(T5, T6, &l); | |
934 __ LoadImmediate(V0, 0); | |
935 __ Bind(&l); | |
936 __ jr(RA); | |
937 } | |
938 | |
939 | |
940 ASSEMBLER_TEST_RUN(Beq_forward_taken, test) { | |
941 typedef int (*SimpleCode)() DART_UNUSED; | |
942 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
943 } | |
944 | |
945 | |
946 ASSEMBLER_TEST_GENERATE(Beq_forward_taken_far, assembler) { | |
947 Label l; | |
948 | |
949 __ set_use_far_branches(true); | |
950 | |
951 __ LoadImmediate(T5, 1); | |
952 __ LoadImmediate(T6, 1); | |
953 | |
954 __ LoadImmediate(V0, 42); | |
955 __ beq(T5, T6, &l); | |
956 __ LoadImmediate(V0, 0); | |
957 __ Bind(&l); | |
958 __ jr(RA); | |
959 } | |
960 | |
961 | |
962 ASSEMBLER_TEST_RUN(Beq_forward_taken_far, test) { | |
963 typedef int (*SimpleCode)() DART_UNUSED; | |
964 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
965 } | |
966 | |
967 | |
968 ASSEMBLER_TEST_GENERATE(Beq_forward_not_taken, assembler) { | |
969 Label l; | |
970 | |
971 __ LoadImmediate(T5, 0); | |
972 __ LoadImmediate(T6, 1); | |
973 | |
974 __ LoadImmediate(V0, 42); | |
975 __ beq(T5, T6, &l); | |
976 __ nop(); | |
977 __ LoadImmediate(V0, 0); | |
978 __ Bind(&l); | |
979 __ jr(RA); | |
980 } | |
981 | |
982 | |
983 ASSEMBLER_TEST_RUN(Beq_forward_not_taken, test) { | |
984 typedef int (*SimpleCode)() DART_UNUSED; | |
985 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
986 } | |
987 | |
988 | |
989 ASSEMBLER_TEST_GENERATE(Beq_forward_not_taken_far, assembler) { | |
990 Label l; | |
991 | |
992 __ set_use_far_branches(true); | |
993 | |
994 __ LoadImmediate(T5, 0); | |
995 __ LoadImmediate(T6, 1); | |
996 | |
997 __ LoadImmediate(V0, 42); | |
998 __ beq(T5, T6, &l); | |
999 __ nop(); | |
1000 __ LoadImmediate(V0, 0); | |
1001 __ Bind(&l); | |
1002 __ jr(RA); | |
1003 } | |
1004 | |
1005 | |
1006 ASSEMBLER_TEST_RUN(Beq_forward_not_taken_far, test) { | |
1007 typedef int (*SimpleCode)() DART_UNUSED; | |
1008 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1009 } | |
1010 | |
1011 | |
1012 ASSEMBLER_TEST_GENERATE(Beq_forward_not_taken_far2, assembler) { | |
1013 Label l; | |
1014 | |
1015 __ set_use_far_branches(true); | |
1016 | |
1017 __ LoadImmediate(T5, 0); | |
1018 __ LoadImmediate(T6, 1); | |
1019 | |
1020 __ LoadImmediate(V0, 42); | |
1021 __ beq(T5, T6, &l); | |
1022 __ nop(); | |
1023 for (int i = 0; i < (1 << 15); i++) { | |
1024 __ nop(); | |
1025 } | |
1026 __ LoadImmediate(V0, 0); | |
1027 __ Bind(&l); | |
1028 __ jr(RA); | |
1029 } | |
1030 | |
1031 | |
1032 ASSEMBLER_TEST_RUN(Beq_forward_not_taken_far2, test) { | |
1033 typedef int (*SimpleCode)() DART_UNUSED; | |
1034 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1035 } | |
1036 | |
1037 | |
1038 ASSEMBLER_TEST_GENERATE(Beq_forward_taken2, assembler) { | |
1039 Label l; | |
1040 | |
1041 __ LoadImmediate(T5, 1); | |
1042 __ LoadImmediate(T6, 1); | |
1043 | |
1044 __ LoadImmediate(V0, 42); | |
1045 __ beq(T5, T6, &l); | |
1046 __ nop(); | |
1047 __ nop(); | |
1048 __ LoadImmediate(V0, 0); | |
1049 __ Bind(&l); | |
1050 __ jr(RA); | |
1051 } | |
1052 | |
1053 | |
1054 ASSEMBLER_TEST_RUN(Beq_forward_taken2, test) { | |
1055 typedef int (*SimpleCode)() DART_UNUSED; | |
1056 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1057 } | |
1058 | |
1059 | |
1060 ASSEMBLER_TEST_GENERATE(Beq_forward_taken_far2, assembler) { | |
1061 Label l; | |
1062 | |
1063 __ set_use_far_branches(true); | |
1064 | |
1065 __ LoadImmediate(T5, 1); | |
1066 __ LoadImmediate(T6, 1); | |
1067 | |
1068 __ LoadImmediate(V0, 42); | |
1069 __ beq(T5, T6, &l); | |
1070 __ nop(); | |
1071 __ nop(); | |
1072 __ LoadImmediate(V0, 0); | |
1073 __ Bind(&l); | |
1074 __ jr(RA); | |
1075 } | |
1076 | |
1077 | |
1078 ASSEMBLER_TEST_RUN(Beq_forward_taken_far2, test) { | |
1079 typedef int (*SimpleCode)() DART_UNUSED; | |
1080 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1081 } | |
1082 | |
1083 | |
1084 ASSEMBLER_TEST_GENERATE(Beq_forward_taken_far3, assembler) { | |
1085 Label l; | |
1086 | |
1087 __ set_use_far_branches(true); | |
1088 | |
1089 __ LoadImmediate(T5, 1); | |
1090 __ LoadImmediate(T6, 1); | |
1091 | |
1092 __ LoadImmediate(V0, 42); | |
1093 __ beq(T5, T6, &l); | |
1094 __ nop(); | |
1095 for (int i = 0; i < (1 << 15); i++) { | |
1096 __ nop(); | |
1097 } | |
1098 __ nop(); | |
1099 __ LoadImmediate(V0, 0); | |
1100 __ Bind(&l); | |
1101 __ jr(RA); | |
1102 } | |
1103 | |
1104 | |
1105 ASSEMBLER_TEST_RUN(Beq_forward_taken_far3, test) { | |
1106 typedef int (*SimpleCode)() DART_UNUSED; | |
1107 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1108 } | |
1109 | |
1110 | |
1111 ASSEMBLER_TEST_GENERATE(Beq_forward_taken_delay, assembler) { | |
1112 Label l; | |
1113 | |
1114 __ LoadImmediate(T5, 1); | |
1115 __ LoadImmediate(T6, 1); | |
1116 | |
1117 __ LoadImmediate(V0, 42); | |
1118 __ beq(T5, T6, &l); | |
1119 __ delay_slot()->ori(V0, V0, Immediate(1)); | |
1120 __ LoadImmediate(V0, 0); | |
1121 __ Bind(&l); | |
1122 __ jr(RA); | |
1123 } | |
1124 | |
1125 | |
1126 ASSEMBLER_TEST_RUN(Beq_forward_taken_delay, test) { | |
1127 typedef int (*SimpleCode)() DART_UNUSED; | |
1128 EXPECT_EQ(43, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1129 } | |
1130 | |
1131 | |
1132 ASSEMBLER_TEST_GENERATE(Beq_forward_not_taken_delay, assembler) { | |
1133 Label l; | |
1134 | |
1135 __ LoadImmediate(T5, 0); | |
1136 __ LoadImmediate(T6, 1); | |
1137 | |
1138 __ LoadImmediate(V0, 42); | |
1139 __ beq(T5, T6, &l); | |
1140 __ delay_slot()->ori(V0, V0, Immediate(1)); | |
1141 __ addiu(V0, V0, Immediate(1)); | |
1142 __ Bind(&l); | |
1143 __ jr(RA); | |
1144 } | |
1145 | |
1146 | |
1147 ASSEMBLER_TEST_RUN(Beq_forward_not_taken_delay, test) { | |
1148 typedef int (*SimpleCode)() DART_UNUSED; | |
1149 EXPECT_EQ(44, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1150 } | |
1151 | |
1152 | |
1153 ASSEMBLER_TEST_GENERATE(Beql_backward_delay, assembler) { | |
1154 Label l; | |
1155 | |
1156 __ LoadImmediate(T5, 0); | |
1157 __ LoadImmediate(T6, 1); | |
1158 __ Bind(&l); | |
1159 __ addiu(T5, T5, Immediate(1)); | |
1160 __ beql(T5, T6, &l); | |
1161 __ delay_slot()->addiu(T5, T5, Immediate(1)); | |
1162 __ ori(V0, T5, Immediate(0)); | |
1163 __ jr(RA); | |
1164 } | |
1165 | |
1166 | |
1167 ASSEMBLER_TEST_RUN(Beql_backward_delay, test) { | |
1168 typedef int (*SimpleCode)() DART_UNUSED; | |
1169 EXPECT_EQ(3, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1170 } | |
1171 | |
1172 | |
1173 ASSEMBLER_TEST_GENERATE(Bgez, assembler) { | |
1174 Label l; | |
1175 | |
1176 __ LoadImmediate(T5, 3); | |
1177 __ Bind(&l); | |
1178 __ bgez(T5, &l); | |
1179 __ delay_slot()->addiu(T5, T5, Immediate(-1)); | |
1180 __ ori(V0, T5, Immediate(0)); | |
1181 __ jr(RA); | |
1182 } | |
1183 | |
1184 | |
1185 ASSEMBLER_TEST_RUN(Bgez, test) { | |
1186 typedef int (*SimpleCode)() DART_UNUSED; | |
1187 EXPECT_EQ(-2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1188 } | |
1189 | |
1190 | |
1191 ASSEMBLER_TEST_GENERATE(Bgez_far, assembler) { | |
1192 Label l; | |
1193 | |
1194 __ set_use_far_branches(true); | |
1195 | |
1196 __ LoadImmediate(T5, 3); | |
1197 __ Bind(&l); | |
1198 __ bgez(T5, &l); | |
1199 __ delay_slot()->addiu(T5, T5, Immediate(-1)); | |
1200 __ ori(V0, T5, Immediate(0)); | |
1201 __ jr(RA); | |
1202 } | |
1203 | |
1204 | |
1205 ASSEMBLER_TEST_RUN(Bgez_far, test) { | |
1206 typedef int (*SimpleCode)() DART_UNUSED; | |
1207 EXPECT_EQ(-2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1208 } | |
1209 | |
1210 | |
1211 ASSEMBLER_TEST_GENERATE(Bgez_far2, assembler) { | |
1212 Label l; | |
1213 | |
1214 __ set_use_far_branches(true); | |
1215 | |
1216 __ LoadImmediate(T5, 3); | |
1217 __ Bind(&l); | |
1218 for (int i = 0; i < (1 << 15); i++) { | |
1219 __ nop(); | |
1220 } | |
1221 __ bgez(T5, &l); | |
1222 __ delay_slot()->addiu(T5, T5, Immediate(-1)); | |
1223 __ ori(V0, T5, Immediate(0)); | |
1224 __ jr(RA); | |
1225 } | |
1226 | |
1227 | |
1228 ASSEMBLER_TEST_RUN(Bgez_far2, test) { | |
1229 typedef int (*SimpleCode)() DART_UNUSED; | |
1230 EXPECT_EQ(-2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1231 } | |
1232 | |
1233 | |
1234 ASSEMBLER_TEST_GENERATE(Bgez_taken_forward_far, assembler) { | |
1235 Label l; | |
1236 | |
1237 __ set_use_far_branches(true); | |
1238 | |
1239 __ LoadImmediate(T5, 1); | |
1240 | |
1241 __ LoadImmediate(V0, 42); | |
1242 __ bgez(T5, &l); | |
1243 __ nop(); | |
1244 __ nop(); | |
1245 __ LoadImmediate(V0, 0); | |
1246 __ Bind(&l); | |
1247 __ jr(RA); | |
1248 } | |
1249 | |
1250 | |
1251 ASSEMBLER_TEST_RUN(Bgez_taken_forward_far, test) { | |
1252 typedef int (*SimpleCode)() DART_UNUSED; | |
1253 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1254 } | |
1255 | |
1256 | |
1257 ASSEMBLER_TEST_GENERATE(Bgez_taken_forward_far2, assembler) { | |
1258 Label l; | |
1259 | |
1260 __ set_use_far_branches(true); | |
1261 | |
1262 __ LoadImmediate(T5, 1); | |
1263 | |
1264 __ LoadImmediate(V0, 42); | |
1265 __ bgez(T5, &l); | |
1266 __ nop(); | |
1267 for (int i = 0; i < (1 << 15); i++) { | |
1268 __ nop(); | |
1269 } | |
1270 __ LoadImmediate(V0, 0); | |
1271 __ Bind(&l); | |
1272 __ jr(RA); | |
1273 } | |
1274 | |
1275 | |
1276 ASSEMBLER_TEST_RUN(Bgez_taken_forward_far2, test) { | |
1277 typedef int (*SimpleCode)() DART_UNUSED; | |
1278 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1279 } | |
1280 | |
1281 | |
1282 ASSEMBLER_TEST_GENERATE(Bgez_not_taken_forward_far, assembler) { | |
1283 Label l; | |
1284 | |
1285 __ set_use_far_branches(true); | |
1286 | |
1287 __ LoadImmediate(T5, -1); | |
1288 | |
1289 __ LoadImmediate(V0, 42); | |
1290 __ bgez(T5, &l); | |
1291 __ nop(); | |
1292 __ nop(); | |
1293 __ LoadImmediate(V0, 0); | |
1294 __ Bind(&l); | |
1295 __ jr(RA); | |
1296 } | |
1297 | |
1298 | |
1299 ASSEMBLER_TEST_RUN(Bgez_not_taken_forward_far, test) { | |
1300 typedef int (*SimpleCode)() DART_UNUSED; | |
1301 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1302 } | |
1303 | |
1304 | |
1305 ASSEMBLER_TEST_GENERATE(Bgez_not_taken_forward_far2, assembler) { | |
1306 Label l; | |
1307 | |
1308 __ set_use_far_branches(true); | |
1309 | |
1310 __ LoadImmediate(T5, -1); | |
1311 | |
1312 __ LoadImmediate(V0, 42); | |
1313 __ bgez(T5, &l); | |
1314 __ nop(); | |
1315 for (int i = 0; i < (1 << 15); i++) { | |
1316 __ nop(); | |
1317 } | |
1318 __ LoadImmediate(V0, 0); | |
1319 __ Bind(&l); | |
1320 __ jr(RA); | |
1321 } | |
1322 | |
1323 | |
1324 ASSEMBLER_TEST_RUN(Bgez_not_taken_forward_far2, test) { | |
1325 typedef int (*SimpleCode)() DART_UNUSED; | |
1326 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1327 } | |
1328 | |
1329 | |
1330 ASSEMBLER_TEST_GENERATE(Bgezl, assembler) { | |
1331 Label l; | |
1332 | |
1333 __ LoadImmediate(T5, 3); | |
1334 __ Bind(&l); | |
1335 __ bgezl(T5, &l); | |
1336 __ delay_slot()->addiu(T5, T5, Immediate(-1)); | |
1337 __ ori(V0, T5, Immediate(0)); | |
1338 __ jr(RA); | |
1339 } | |
1340 | |
1341 | |
1342 ASSEMBLER_TEST_RUN(Bgezl, test) { | |
1343 typedef int (*SimpleCode)() DART_UNUSED; | |
1344 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1345 } | |
1346 | |
1347 | |
1348 ASSEMBLER_TEST_GENERATE(Blez, assembler) { | |
1349 Label l; | |
1350 | |
1351 __ LoadImmediate(T5, -3); | |
1352 __ Bind(&l); | |
1353 __ blez(T5, &l); | |
1354 __ delay_slot()->addiu(T5, T5, Immediate(1)); | |
1355 __ ori(V0, T5, Immediate(0)); | |
1356 __ jr(RA); | |
1357 } | |
1358 | |
1359 | |
1360 ASSEMBLER_TEST_RUN(Blez, test) { | |
1361 typedef int (*SimpleCode)() DART_UNUSED; | |
1362 EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1363 } | |
1364 | |
1365 | |
1366 ASSEMBLER_TEST_GENERATE(Blez_far, assembler) { | |
1367 Label l; | |
1368 | |
1369 __ set_use_far_branches(true); | |
1370 | |
1371 __ LoadImmediate(T5, -3); | |
1372 __ Bind(&l); | |
1373 __ blez(T5, &l); | |
1374 __ delay_slot()->addiu(T5, T5, Immediate(1)); | |
1375 __ ori(V0, T5, Immediate(0)); | |
1376 __ jr(RA); | |
1377 } | |
1378 | |
1379 | |
1380 ASSEMBLER_TEST_RUN(Blez_far, test) { | |
1381 typedef int (*SimpleCode)() DART_UNUSED; | |
1382 EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1383 } | |
1384 | |
1385 | |
1386 ASSEMBLER_TEST_GENERATE(Blez_far2, assembler) { | |
1387 Label l; | |
1388 | |
1389 __ set_use_far_branches(true); | |
1390 | |
1391 __ LoadImmediate(T5, -3); | |
1392 __ Bind(&l); | |
1393 for (int i = 0; i < (1 << 15); i++) { | |
1394 __ nop(); | |
1395 } | |
1396 __ blez(T5, &l); | |
1397 __ delay_slot()->addiu(T5, T5, Immediate(1)); | |
1398 __ ori(V0, T5, Immediate(0)); | |
1399 __ jr(RA); | |
1400 } | |
1401 | |
1402 | |
1403 ASSEMBLER_TEST_RUN(Blez_far2, test) { | |
1404 typedef int (*SimpleCode)() DART_UNUSED; | |
1405 EXPECT_EQ(2, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1406 } | |
1407 | |
1408 | |
1409 ASSEMBLER_TEST_GENERATE(Blez_taken_forward_far, assembler) { | |
1410 Label l; | |
1411 | |
1412 __ set_use_far_branches(true); | |
1413 | |
1414 __ LoadImmediate(T5, -1); | |
1415 | |
1416 __ LoadImmediate(V0, 42); | |
1417 __ blez(T5, &l); | |
1418 __ nop(); | |
1419 __ nop(); | |
1420 __ LoadImmediate(V0, 0); | |
1421 __ Bind(&l); | |
1422 __ jr(RA); | |
1423 } | |
1424 | |
1425 | |
1426 ASSEMBLER_TEST_RUN(Blez_taken_forward_far, test) { | |
1427 typedef int (*SimpleCode)() DART_UNUSED; | |
1428 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1429 } | |
1430 | |
1431 | |
1432 ASSEMBLER_TEST_GENERATE(Blez_not_taken_forward_far, assembler) { | |
1433 Label l; | |
1434 | |
1435 __ set_use_far_branches(true); | |
1436 | |
1437 __ LoadImmediate(T5, 1); | |
1438 | |
1439 __ LoadImmediate(V0, 42); | |
1440 __ blez(T5, &l); | |
1441 __ nop(); | |
1442 __ nop(); | |
1443 __ LoadImmediate(V0, 0); | |
1444 __ Bind(&l); | |
1445 __ jr(RA); | |
1446 } | |
1447 | |
1448 | |
1449 ASSEMBLER_TEST_RUN(Blez_not_taken_forward_far, test) { | |
1450 typedef int (*SimpleCode)() DART_UNUSED; | |
1451 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1452 } | |
1453 | |
1454 | |
1455 ASSEMBLER_TEST_GENERATE(Blezl, assembler) { | |
1456 Label l; | |
1457 | |
1458 __ LoadImmediate(T5, -3); | |
1459 __ Bind(&l); | |
1460 __ blezl(T5, &l); | |
1461 __ delay_slot()->addiu(T5, T5, Immediate(1)); | |
1462 __ ori(V0, T5, Immediate(0)); | |
1463 __ jr(RA); | |
1464 } | |
1465 | |
1466 | |
1467 ASSEMBLER_TEST_RUN(Blezl, test) { | |
1468 typedef int (*SimpleCode)() DART_UNUSED; | |
1469 EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1470 } | |
1471 | |
1472 | |
1473 ASSEMBLER_TEST_GENERATE(Bgtz, assembler) { | |
1474 Label l; | |
1475 | |
1476 __ LoadImmediate(T5, 3); | |
1477 __ Bind(&l); | |
1478 __ bgtz(T5, &l); | |
1479 __ delay_slot()->addiu(T5, T5, Immediate(-1)); | |
1480 __ ori(V0, T5, Immediate(0)); | |
1481 __ jr(RA); | |
1482 } | |
1483 | |
1484 | |
1485 ASSEMBLER_TEST_RUN(Bgtz, test) { | |
1486 typedef int (*SimpleCode)() DART_UNUSED; | |
1487 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1488 } | |
1489 | |
1490 | |
1491 ASSEMBLER_TEST_GENERATE(Bgtzl, assembler) { | |
1492 Label l; | |
1493 | |
1494 __ LoadImmediate(T5, 3); | |
1495 __ Bind(&l); | |
1496 __ bgtzl(T5, &l); | |
1497 __ delay_slot()->addiu(T5, T5, Immediate(-1)); | |
1498 __ ori(V0, T5, Immediate(0)); | |
1499 __ jr(RA); | |
1500 } | |
1501 | |
1502 | |
1503 ASSEMBLER_TEST_RUN(Bgtzl, test) { | |
1504 typedef int (*SimpleCode)() DART_UNUSED; | |
1505 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1506 } | |
1507 | |
1508 | |
1509 ASSEMBLER_TEST_GENERATE(Bltz, assembler) { | |
1510 Label l; | |
1511 | |
1512 __ LoadImmediate(T5, -3); | |
1513 __ Bind(&l); | |
1514 __ bltz(T5, &l); | |
1515 __ delay_slot()->addiu(T5, T5, Immediate(1)); | |
1516 __ ori(V0, T5, Immediate(0)); | |
1517 __ jr(RA); | |
1518 } | |
1519 | |
1520 | |
1521 ASSEMBLER_TEST_RUN(Bltz, test) { | |
1522 typedef int (*SimpleCode)() DART_UNUSED; | |
1523 EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1524 } | |
1525 | |
1526 | |
1527 ASSEMBLER_TEST_GENERATE(Bltzl, assembler) { | |
1528 Label l; | |
1529 | |
1530 __ LoadImmediate(T5, -3); | |
1531 __ Bind(&l); | |
1532 __ bltzl(T5, &l); | |
1533 __ delay_slot()->addiu(T5, T5, Immediate(1)); | |
1534 __ ori(V0, T5, Immediate(0)); | |
1535 __ jr(RA); | |
1536 } | |
1537 | |
1538 | |
1539 ASSEMBLER_TEST_RUN(Bltzl, test) { | |
1540 typedef int (*SimpleCode)() DART_UNUSED; | |
1541 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1542 } | |
1543 | |
1544 | |
1545 ASSEMBLER_TEST_GENERATE(Bne, assembler) { | |
1546 Label l; | |
1547 | |
1548 __ LoadImmediate(T5, 3); | |
1549 __ Bind(&l); | |
1550 __ bne(T5, R0, &l); | |
1551 __ delay_slot()->addiu(T5, T5, Immediate(-1)); | |
1552 __ ori(V0, T5, Immediate(0)); | |
1553 __ jr(RA); | |
1554 } | |
1555 | |
1556 | |
1557 ASSEMBLER_TEST_RUN(Bne, test) { | |
1558 typedef int (*SimpleCode)() DART_UNUSED; | |
1559 EXPECT_EQ(-1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1560 } | |
1561 | |
1562 | |
1563 ASSEMBLER_TEST_GENERATE(Bnel, assembler) { | |
1564 Label l; | |
1565 | |
1566 __ LoadImmediate(T5, 3); | |
1567 __ Bind(&l); | |
1568 __ bnel(T5, R0, &l); | |
1569 __ delay_slot()->addiu(T5, T5, Immediate(-1)); | |
1570 __ ori(V0, T5, Immediate(0)); | |
1571 __ jr(RA); | |
1572 } | |
1573 | |
1574 | |
1575 ASSEMBLER_TEST_RUN(Bnel, test) { | |
1576 typedef int (*SimpleCode)() DART_UNUSED; | |
1577 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1578 } | |
1579 | |
1580 | |
1581 ASSEMBLER_TEST_GENERATE(Label_link1, assembler) { | |
1582 Label l; | |
1583 | |
1584 __ bgez(ZR, &l); | |
1585 __ bgez(ZR, &l); | |
1586 __ bgez(ZR, &l); | |
1587 | |
1588 __ LoadImmediate(V0, 1); | |
1589 __ Bind(&l); | |
1590 __ mov(V0, ZR); | |
1591 __ jr(RA); | |
1592 } | |
1593 | |
1594 | |
1595 ASSEMBLER_TEST_RUN(Label_link1, test) { | |
1596 typedef int (*SimpleCode)() DART_UNUSED; | |
1597 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1598 } | |
1599 | |
1600 | |
1601 ASSEMBLER_TEST_GENERATE(Label_link2, assembler) { | |
1602 Label l; | |
1603 | |
1604 __ beq(ZR, ZR, &l); | |
1605 __ beq(ZR, ZR, &l); | |
1606 __ beq(ZR, ZR, &l); | |
1607 | |
1608 __ LoadImmediate(V0, 1); | |
1609 __ Bind(&l); | |
1610 __ mov(V0, ZR); | |
1611 __ jr(RA); | |
1612 } | |
1613 | |
1614 | |
1615 ASSEMBLER_TEST_RUN(Label_link2, test) { | |
1616 typedef int (*SimpleCode)() DART_UNUSED; | |
1617 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1618 } | |
1619 | |
1620 | |
1621 ASSEMBLER_TEST_GENERATE(Jalr_delay, assembler) { | |
1622 __ mov(T2, RA); | |
1623 __ jalr(T2, RA); | |
1624 __ delay_slot()->ori(V0, ZR, Immediate(42)); | |
1625 } | |
1626 | |
1627 | |
1628 ASSEMBLER_TEST_RUN(Jalr_delay, test) { | |
1629 typedef int (*SimpleCode)() DART_UNUSED; | |
1630 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1631 } | |
1632 | |
1633 | |
1634 ASSEMBLER_TEST_GENERATE(AddOverflow_detect, assembler) { | |
1635 Register left = T0; | |
1636 Register right = T1; | |
1637 Register result = T2; | |
1638 Register overflow = T3; | |
1639 Register scratch = T4; | |
1640 Label error, done; | |
1641 | |
1642 __ LoadImmediate(V0, 1); // Success value. | |
1643 | |
1644 __ LoadImmediate(left, 0x7fffffff); | |
1645 __ LoadImmediate(right, 1); | |
1646 __ AdduDetectOverflow(result, left, right, overflow); | |
1647 __ bgez(overflow, &error); // INT_MAX + 1 overflows. | |
1648 | |
1649 __ LoadImmediate(left, 0x7fffffff); | |
1650 __ AdduDetectOverflow(result, left, left, overflow); | |
1651 __ bgez(overflow, &error); // INT_MAX + INT_MAX overflows. | |
1652 | |
1653 __ LoadImmediate(left, 0x7fffffff); | |
1654 __ LoadImmediate(right, -1); | |
1655 __ AdduDetectOverflow(result, left, right, overflow); | |
1656 __ bltz(overflow, &error); // INT_MAX - 1 does not overflow. | |
1657 | |
1658 __ LoadImmediate(left, -1); | |
1659 __ LoadImmediate(right, 1); | |
1660 __ AdduDetectOverflow(result, left, right, overflow); | |
1661 __ bltz(overflow, &error); // -1 + 1 does not overflow. | |
1662 | |
1663 __ LoadImmediate(left, 123456); | |
1664 __ LoadImmediate(right, 654321); | |
1665 __ AdduDetectOverflow(result, left, right, overflow); | |
1666 __ bltz(overflow, &error); // 123456 + 654321 does not overflow. | |
1667 | |
1668 __ LoadImmediate(left, 0x80000000); | |
1669 __ LoadImmediate(right, -1); | |
1670 __ AdduDetectOverflow(result, left, right, overflow); | |
1671 __ bgez(overflow, &error); // INT_MIN - 1 overflows. | |
1672 | |
1673 // result has 0x7fffffff. | |
1674 __ AdduDetectOverflow(result, result, result, overflow, scratch); | |
1675 __ bgez(overflow, &error); // INT_MAX + INT_MAX overflows. | |
1676 | |
1677 __ LoadImmediate(left, 0x80000000); | |
1678 __ LoadImmediate(right, 0x80000000); | |
1679 __ AdduDetectOverflow(result, left, right, overflow); | |
1680 __ bgez(overflow, &error); // INT_MIN + INT_MIN overflows. | |
1681 | |
1682 __ LoadImmediate(left, -123456); | |
1683 __ LoadImmediate(right, -654321); | |
1684 __ AdduDetectOverflow(result, left, right, overflow); | |
1685 __ bltz(overflow, &error); // -123456 + -654321 does not overflow. | |
1686 | |
1687 __ b(&done); | |
1688 __ Bind(&error); | |
1689 __ mov(V0, ZR); | |
1690 __ Bind(&done); | |
1691 __ Ret(); | |
1692 } | |
1693 | |
1694 | |
1695 ASSEMBLER_TEST_RUN(AddOverflow_detect, test) { | |
1696 typedef int (*SimpleCode)() DART_UNUSED; | |
1697 EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1698 } | |
1699 | |
1700 | |
1701 ASSEMBLER_TEST_GENERATE(SubOverflow_detect, assembler) { | |
1702 Register left = T0; | |
1703 Register right = T1; | |
1704 Register result = T2; | |
1705 Register overflow = T3; | |
1706 Label error, done; | |
1707 | |
1708 __ LoadImmediate(V0, 1); // Success value. | |
1709 | |
1710 __ LoadImmediate(left, 0x80000000); | |
1711 __ LoadImmediate(right, 1); | |
1712 __ SubuDetectOverflow(result, left, right, overflow); | |
1713 __ bgez(overflow, &error); // INT_MIN - 1 overflows. | |
1714 | |
1715 __ LoadImmediate(left, 0x7fffffff); | |
1716 __ LoadImmediate(right, 0x8000000); | |
1717 __ SubuDetectOverflow(result, left, left, overflow); | |
1718 __ bltz(overflow, &error); // INT_MIN - INT_MAX does not overflow. | |
1719 | |
1720 __ LoadImmediate(left, 0x80000000); | |
1721 __ LoadImmediate(right, 0x80000000); | |
1722 __ SubuDetectOverflow(result, left, right, overflow); | |
1723 __ bltz(overflow, &error); // INT_MIN - INT_MIN does not overflow. | |
1724 | |
1725 __ LoadImmediate(left, 0x7fffffff); | |
1726 __ LoadImmediate(right, 0x80000000); | |
1727 __ SubuDetectOverflow(result, left, right, overflow); | |
1728 __ bgez(overflow, &error); // INT_MAX - INT_MIN overflows. | |
1729 | |
1730 __ LoadImmediate(left, 1); | |
1731 __ LoadImmediate(right, -1); | |
1732 __ SubuDetectOverflow(result, left, right, overflow); | |
1733 __ bltz(overflow, &error); // 1 - -1 does not overflow. | |
1734 | |
1735 __ b(&done); | |
1736 __ Bind(&error); | |
1737 __ mov(V0, ZR); | |
1738 __ Bind(&done); | |
1739 __ Ret(); | |
1740 } | |
1741 | |
1742 | |
1743 ASSEMBLER_TEST_RUN(SubOverflow_detect, test) { | |
1744 typedef int (*SimpleCode)() DART_UNUSED; | |
1745 EXPECT_EQ(1, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1746 } | |
1747 | |
1748 | |
1749 ASSEMBLER_TEST_GENERATE(Mtc1Mfc1, assembler) { | |
1750 __ mtc1(ZR, F0); | |
1751 __ mtc1(ZR, F1); | |
1752 __ mfc1(V0, F0); | |
1753 __ mfc1(V1, F1); | |
1754 __ Ret(); | |
1755 } | |
1756 | |
1757 | |
1758 ASSEMBLER_TEST_RUN(Mtc1Mfc1, test) { | |
1759 typedef int (*SimpleCode)() DART_UNUSED; | |
1760 EXPECT(test != NULL); | |
1761 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1762 } | |
1763 | |
1764 | |
1765 ASSEMBLER_TEST_GENERATE(Addd, assembler) { | |
1766 __ LoadImmediate(D0, 1.0); | |
1767 __ LoadImmediate(D1, 2.0); | |
1768 __ addd(D0, D0, D1); | |
1769 __ Ret(); | |
1770 } | |
1771 | |
1772 | |
1773 ASSEMBLER_TEST_RUN(Addd, test) { | |
1774 typedef double (*SimpleCode)() DART_UNUSED; | |
1775 EXPECT(test != NULL); | |
1776 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1777 EXPECT_FLOAT_EQ(3.0, res, 0.001); | |
1778 } | |
1779 | |
1780 | |
1781 ASSEMBLER_TEST_GENERATE(Movd, assembler) { | |
1782 __ LoadImmediate(D1, 1.0); | |
1783 __ movd(D0, D1); | |
1784 __ Ret(); | |
1785 } | |
1786 | |
1787 | |
1788 ASSEMBLER_TEST_RUN(Movd, test) { | |
1789 typedef double (*SimpleCode)() DART_UNUSED; | |
1790 EXPECT(test != NULL); | |
1791 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1792 EXPECT_FLOAT_EQ(1.0, res, 0.001); | |
1793 } | |
1794 | |
1795 | |
1796 ASSEMBLER_TEST_GENERATE(Negd, assembler) { | |
1797 __ LoadImmediate(D1, 1.0); | |
1798 __ negd(D0, D1); | |
1799 __ Ret(); | |
1800 } | |
1801 | |
1802 | |
1803 ASSEMBLER_TEST_RUN(Negd, test) { | |
1804 typedef double (*SimpleCode)() DART_UNUSED; | |
1805 EXPECT(test != NULL); | |
1806 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1807 EXPECT_FLOAT_EQ(-1.0, res, 0.001); | |
1808 } | |
1809 | |
1810 | |
1811 ASSEMBLER_TEST_GENERATE(Sdc1Ldc1, assembler) { | |
1812 __ mov(T0, SP); | |
1813 __ AddImmediate(SP, -3 * kWordSize); | |
1814 __ AndImmediate(SP, SP, ~(8 - 1)); // Align SP by 8 bytes. | |
1815 __ LoadImmediate(D1, 1.0); | |
1816 __ sdc1(D1, Address(SP)); | |
1817 __ ldc1(D0, Address(SP)); | |
1818 __ mov(SP, T0); | |
1819 __ Ret(); | |
1820 } | |
1821 | |
1822 | |
1823 ASSEMBLER_TEST_RUN(Sdc1Ldc1, test) { | |
1824 typedef double (*SimpleCode)() DART_UNUSED; | |
1825 EXPECT(test != NULL); | |
1826 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1827 EXPECT_FLOAT_EQ(1.0, res, 0.001); | |
1828 } | |
1829 | |
1830 | |
1831 ASSEMBLER_TEST_GENERATE(Addd_NaN, assembler) { | |
1832 __ LoadImmediate(D0, 1.0); | |
1833 // Double non-signaling NaN is 0x7FF8000000000000. | |
1834 __ LoadImmediate(T0, 0x7FF80000); | |
1835 __ mtc1(ZR, F2); // Load upper bits of NaN. | |
1836 __ mtc1(T0, F3); // Load lower bits of NaN. | |
1837 __ addd(D0, D0, D1); | |
1838 __ Ret(); | |
1839 } | |
1840 | |
1841 | |
1842 ASSEMBLER_TEST_RUN(Addd_NaN, test) { | |
1843 typedef double (*SimpleCode)() DART_UNUSED; | |
1844 EXPECT(test != NULL); | |
1845 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1846 EXPECT_EQ(isnan(res), true); | |
1847 } | |
1848 | |
1849 | |
1850 ASSEMBLER_TEST_GENERATE(Addd_Inf, assembler) { | |
1851 __ LoadImmediate(D0, 1.0); | |
1852 __ LoadImmediate(T0, 0x7FF00000); // +inf | |
1853 __ mtc1(ZR, F2); | |
1854 __ mtc1(T0, F3); | |
1855 __ addd(D0, D0, D1); | |
1856 __ Ret(); | |
1857 } | |
1858 | |
1859 | |
1860 ASSEMBLER_TEST_RUN(Addd_Inf, test) { | |
1861 typedef double (*SimpleCode)() DART_UNUSED; | |
1862 EXPECT(test != NULL); | |
1863 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1864 EXPECT_EQ(isfinite(res), false); | |
1865 } | |
1866 | |
1867 | |
1868 ASSEMBLER_TEST_GENERATE(Subd, assembler) { | |
1869 __ LoadImmediate(D0, 2.5); | |
1870 __ LoadImmediate(D1, 1.5); | |
1871 __ subd(D0, D0, D1); | |
1872 __ Ret(); | |
1873 } | |
1874 | |
1875 | |
1876 ASSEMBLER_TEST_RUN(Subd, test) { | |
1877 typedef double (*SimpleCode)() DART_UNUSED; | |
1878 EXPECT(test != NULL); | |
1879 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1880 EXPECT_FLOAT_EQ(1.0, res, 0.001); | |
1881 } | |
1882 | |
1883 | |
1884 ASSEMBLER_TEST_GENERATE(Muld, assembler) { | |
1885 __ LoadImmediate(D0, 6.0); | |
1886 __ LoadImmediate(D1, 7.0); | |
1887 __ muld(D0, D0, D1); | |
1888 __ Ret(); | |
1889 } | |
1890 | |
1891 | |
1892 ASSEMBLER_TEST_RUN(Muld, test) { | |
1893 typedef double (*SimpleCode)() DART_UNUSED; | |
1894 EXPECT(test != NULL); | |
1895 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1896 EXPECT_FLOAT_EQ(42.0, res, 0.001); | |
1897 } | |
1898 | |
1899 | |
1900 ASSEMBLER_TEST_GENERATE(Divd, assembler) { | |
1901 __ LoadImmediate(D0, 42.0); | |
1902 __ LoadImmediate(D1, 7.0); | |
1903 __ divd(D0, D0, D1); | |
1904 __ Ret(); | |
1905 } | |
1906 | |
1907 | |
1908 ASSEMBLER_TEST_RUN(Divd, test) { | |
1909 typedef double (*SimpleCode)() DART_UNUSED; | |
1910 EXPECT(test != NULL); | |
1911 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1912 EXPECT_FLOAT_EQ(6.0, res, 0.001); | |
1913 } | |
1914 | |
1915 | |
1916 ASSEMBLER_TEST_GENERATE(Sqrtd, assembler) { | |
1917 __ LoadImmediate(D1, 36.0); | |
1918 __ sqrtd(D0, D1); | |
1919 __ Ret(); | |
1920 } | |
1921 | |
1922 | |
1923 ASSEMBLER_TEST_RUN(Sqrtd, test) { | |
1924 typedef double (*SimpleCode)() DART_UNUSED; | |
1925 EXPECT(test != NULL); | |
1926 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
1927 EXPECT_FLOAT_EQ(6.0, res, 0.001); | |
1928 } | |
1929 | |
1930 | |
1931 ASSEMBLER_TEST_GENERATE(Cop1CUN, assembler) { | |
1932 Label is_true; | |
1933 | |
1934 __ LoadImmediate(D0, 42.0); | |
1935 __ LoadImmediate(T0, 0x7FF80000); | |
1936 __ mtc1(ZR, F2); | |
1937 __ mtc1(T0, F3); | |
1938 __ LoadImmediate(V0, 42); | |
1939 __ cund(D0, D1); | |
1940 __ bc1t(&is_true); | |
1941 __ mov(V0, ZR); | |
1942 __ Bind(&is_true); | |
1943 __ Ret(); | |
1944 } | |
1945 | |
1946 | |
1947 ASSEMBLER_TEST_RUN(Cop1CUN, test) { | |
1948 typedef int (*SimpleCode)() DART_UNUSED; | |
1949 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1950 } | |
1951 | |
1952 | |
1953 ASSEMBLER_TEST_GENERATE(Cop1CUN_not_taken, assembler) { | |
1954 Label is_true; | |
1955 | |
1956 __ LoadImmediate(D0, 42.0); | |
1957 __ LoadImmediate(D1, 42.0); | |
1958 __ LoadImmediate(V0, 42); | |
1959 __ cund(D0, D1); | |
1960 __ bc1t(&is_true); | |
1961 __ mov(V0, ZR); | |
1962 __ Bind(&is_true); | |
1963 __ Ret(); | |
1964 } | |
1965 | |
1966 | |
1967 ASSEMBLER_TEST_RUN(Cop1CUN_not_taken, test) { | |
1968 typedef int (*SimpleCode)() DART_UNUSED; | |
1969 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1970 } | |
1971 | |
1972 | |
1973 ASSEMBLER_TEST_GENERATE(Cop1CEq, assembler) { | |
1974 Label is_true; | |
1975 | |
1976 __ LoadImmediate(D0, 42.5); | |
1977 __ LoadImmediate(D1, 42.5); | |
1978 __ LoadImmediate(V0, 42); | |
1979 __ ceqd(D0, D1); | |
1980 __ bc1t(&is_true); | |
1981 __ mov(V0, ZR); | |
1982 __ Bind(&is_true); | |
1983 __ Ret(); | |
1984 } | |
1985 | |
1986 | |
1987 ASSEMBLER_TEST_RUN(Cop1CEq, test) { | |
1988 typedef int (*SimpleCode)() DART_UNUSED; | |
1989 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
1990 } | |
1991 | |
1992 | |
1993 ASSEMBLER_TEST_GENERATE(Cop1CEq_not_taken, assembler) { | |
1994 Label is_true; | |
1995 | |
1996 __ LoadImmediate(D0, 42.0); | |
1997 __ LoadImmediate(D1, 42.5); | |
1998 __ LoadImmediate(V0, 42); | |
1999 __ ceqd(D0, D1); | |
2000 __ bc1t(&is_true); | |
2001 __ mov(V0, ZR); | |
2002 __ Bind(&is_true); | |
2003 __ Ret(); | |
2004 } | |
2005 | |
2006 | |
2007 ASSEMBLER_TEST_RUN(Cop1CEq_not_taken, test) { | |
2008 typedef int (*SimpleCode)() DART_UNUSED; | |
2009 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2010 } | |
2011 | |
2012 | |
2013 ASSEMBLER_TEST_GENERATE(Cop1CEq_false, assembler) { | |
2014 Label is_true; | |
2015 | |
2016 __ LoadImmediate(D0, 42.0); | |
2017 __ LoadImmediate(D1, 42.5); | |
2018 __ LoadImmediate(V0, 42); | |
2019 __ ceqd(D0, D1); | |
2020 __ bc1f(&is_true); | |
2021 __ mov(V0, ZR); | |
2022 __ Bind(&is_true); | |
2023 __ Ret(); | |
2024 } | |
2025 | |
2026 | |
2027 ASSEMBLER_TEST_RUN(Cop1CEq_false, test) { | |
2028 typedef int (*SimpleCode)() DART_UNUSED; | |
2029 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2030 } | |
2031 | |
2032 | |
2033 ASSEMBLER_TEST_GENERATE(Cop1CEq_false_not_taken, assembler) { | |
2034 Label is_true; | |
2035 | |
2036 __ LoadImmediate(D0, 42.5); | |
2037 __ LoadImmediate(D1, 42.5); | |
2038 __ LoadImmediate(V0, 42); | |
2039 __ ceqd(D0, D1); | |
2040 __ bc1f(&is_true); | |
2041 __ mov(V0, ZR); | |
2042 __ Bind(&is_true); | |
2043 __ Ret(); | |
2044 } | |
2045 | |
2046 | |
2047 ASSEMBLER_TEST_RUN(Cop1CEq_false_not_taken, test) { | |
2048 typedef int (*SimpleCode)() DART_UNUSED; | |
2049 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2050 } | |
2051 | |
2052 | |
2053 ASSEMBLER_TEST_GENERATE(Cop1COLT, assembler) { | |
2054 Label is_true; | |
2055 | |
2056 __ LoadImmediate(D0, 42.0); | |
2057 __ LoadImmediate(D1, 42.5); | |
2058 __ LoadImmediate(V0, 42); | |
2059 __ coltd(D0, D1); | |
2060 __ bc1t(&is_true); | |
2061 __ mov(V0, ZR); | |
2062 __ Bind(&is_true); | |
2063 __ Ret(); | |
2064 } | |
2065 | |
2066 | |
2067 ASSEMBLER_TEST_RUN(Cop1COLT, test) { | |
2068 typedef int (*SimpleCode)() DART_UNUSED; | |
2069 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2070 } | |
2071 | |
2072 | |
2073 ASSEMBLER_TEST_GENERATE(Cop1COLT_not_taken, assembler) { | |
2074 Label is_true; | |
2075 | |
2076 __ LoadImmediate(D0, 42.5); | |
2077 __ LoadImmediate(D1, 42.0); | |
2078 __ LoadImmediate(V0, 42); | |
2079 __ coltd(D0, D1); | |
2080 __ bc1t(&is_true); | |
2081 __ mov(V0, ZR); | |
2082 __ Bind(&is_true); | |
2083 __ Ret(); | |
2084 } | |
2085 | |
2086 | |
2087 ASSEMBLER_TEST_RUN(Cop1COLT_not_taken, test) { | |
2088 typedef int (*SimpleCode)() DART_UNUSED; | |
2089 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2090 } | |
2091 | |
2092 | |
2093 ASSEMBLER_TEST_GENERATE(Cop1COLE, assembler) { | |
2094 Label is_true; | |
2095 | |
2096 __ LoadImmediate(D0, 42.0); | |
2097 __ LoadImmediate(D1, 42.0); | |
2098 __ LoadImmediate(V0, 42); | |
2099 __ coled(D0, D1); | |
2100 __ bc1t(&is_true); | |
2101 __ mov(V0, ZR); | |
2102 __ Bind(&is_true); | |
2103 __ Ret(); | |
2104 } | |
2105 | |
2106 | |
2107 ASSEMBLER_TEST_RUN(Cop1COLE, test) { | |
2108 typedef int (*SimpleCode)() DART_UNUSED; | |
2109 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2110 } | |
2111 | |
2112 | |
2113 ASSEMBLER_TEST_GENERATE(Cop1COLE_not_taken, assembler) { | |
2114 Label is_true; | |
2115 | |
2116 __ LoadImmediate(D0, 42.5); | |
2117 __ LoadImmediate(D1, 42.0); | |
2118 __ LoadImmediate(V0, 42); | |
2119 __ coled(D0, D1); | |
2120 __ bc1t(&is_true); | |
2121 __ mov(V0, ZR); | |
2122 __ Bind(&is_true); | |
2123 __ Ret(); | |
2124 } | |
2125 | |
2126 | |
2127 ASSEMBLER_TEST_RUN(Cop1COLE_not_taken, test) { | |
2128 typedef int (*SimpleCode)() DART_UNUSED; | |
2129 EXPECT_EQ(0, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2130 } | |
2131 | |
2132 | |
2133 ASSEMBLER_TEST_GENERATE(Cop1TruncWD, assembler) { | |
2134 __ LoadImmediate(D1, 42.9); | |
2135 __ truncwd(F0, D1); | |
2136 __ mfc1(V0, F0); | |
2137 __ Ret(); | |
2138 } | |
2139 | |
2140 | |
2141 ASSEMBLER_TEST_RUN(Cop1TruncWD, test) { | |
2142 typedef int (*SimpleCode)() DART_UNUSED; | |
2143 EXPECT(test != NULL); | |
2144 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2145 } | |
2146 | |
2147 | |
2148 ASSEMBLER_TEST_GENERATE(Cop1TruncWD_neg, assembler) { | |
2149 __ LoadImmediate(D1, -42.9); | |
2150 __ truncwd(F0, D1); | |
2151 __ mfc1(V0, F0); | |
2152 __ Ret(); | |
2153 } | |
2154 | |
2155 | |
2156 ASSEMBLER_TEST_RUN(Cop1TruncWD_neg, test) { | |
2157 typedef int (*SimpleCode)() DART_UNUSED; | |
2158 EXPECT(test != NULL); | |
2159 EXPECT_EQ(-42, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2160 } | |
2161 | |
2162 | |
2163 ASSEMBLER_TEST_GENERATE(Cop1TruncWD_NaN, assembler) { | |
2164 // Double non-signaling NaN is 0x7FF8000000000000. | |
2165 __ LoadImmediate(T0, 0x7FF80000); | |
2166 __ mtc1(ZR, F2); // Load upper bits of NaN. | |
2167 __ mtc1(T0, F3); // Load lower bits of NaN. | |
2168 __ truncwd(F0, D1); | |
2169 __ mfc1(V0, F0); | |
2170 __ Ret(); | |
2171 } | |
2172 | |
2173 | |
2174 ASSEMBLER_TEST_RUN(Cop1TruncWD_NaN, test) { | |
2175 typedef int (*SimpleCode)() DART_UNUSED; | |
2176 EXPECT(test != NULL); | |
2177 EXPECT_EQ(kMaxInt32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2178 } | |
2179 | |
2180 | |
2181 ASSEMBLER_TEST_GENERATE(Cop1TruncWD_Inf, assembler) { | |
2182 __ LoadImmediate(T0, 0x7FF00000); // +inf | |
2183 __ mtc1(ZR, F2); | |
2184 __ mtc1(T0, F3); | |
2185 __ truncwd(F0, D1); | |
2186 __ mfc1(V0, F0); | |
2187 __ Ret(); | |
2188 } | |
2189 | |
2190 | |
2191 ASSEMBLER_TEST_RUN(Cop1TruncWD_Inf, test) { | |
2192 typedef int (*SimpleCode)() DART_UNUSED; | |
2193 EXPECT(test != NULL); | |
2194 EXPECT_EQ(kMaxInt32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2195 } | |
2196 | |
2197 | |
2198 ASSEMBLER_TEST_GENERATE(Cop1TruncWD_Overflow, assembler) { | |
2199 __ LoadImmediate(D1, 2.0 * kMaxInt32); | |
2200 __ truncwd(F0, D1); | |
2201 __ mfc1(V0, F0); | |
2202 __ Ret(); | |
2203 } | |
2204 | |
2205 | |
2206 ASSEMBLER_TEST_RUN(Cop1TruncWD_Overflow, test) { | |
2207 typedef int (*SimpleCode)() DART_UNUSED; | |
2208 EXPECT(test != NULL); | |
2209 EXPECT_EQ(kMaxInt32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2210 } | |
2211 | |
2212 | |
2213 ASSEMBLER_TEST_GENERATE(Cop1TruncWD_Underflow, assembler) { | |
2214 __ LoadImmediate(D1, 2.0 * kMinInt32); | |
2215 __ truncwd(F0, D1); | |
2216 __ mfc1(V0, F0); | |
2217 __ Ret(); | |
2218 } | |
2219 | |
2220 | |
2221 ASSEMBLER_TEST_RUN(Cop1TruncWD_Underflow, test) { | |
2222 typedef int (*SimpleCode)() DART_UNUSED; | |
2223 EXPECT(test != NULL); | |
2224 EXPECT_EQ(kMaxInt32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry())); | |
2225 } | |
2226 | |
2227 | |
2228 ASSEMBLER_TEST_GENERATE(Cop1CvtDW, assembler) { | |
2229 __ LoadImmediate(T0, 42); | |
2230 __ mtc1(T0, F2); | |
2231 __ cvtdw(D0, F2); | |
2232 __ Ret(); | |
2233 } | |
2234 | |
2235 | |
2236 ASSEMBLER_TEST_RUN(Cop1CvtDW, test) { | |
2237 typedef double (*SimpleCode)() DART_UNUSED; | |
2238 EXPECT(test != NULL); | |
2239 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
2240 EXPECT_FLOAT_EQ(42.0, res, 0.001); | |
2241 } | |
2242 | |
2243 | |
2244 ASSEMBLER_TEST_GENERATE(Cop1CvtDW_neg, assembler) { | |
2245 __ LoadImmediate(T0, -42); | |
2246 __ mtc1(T0, F2); | |
2247 __ cvtdw(D0, F2); | |
2248 __ Ret(); | |
2249 } | |
2250 | |
2251 | |
2252 ASSEMBLER_TEST_RUN(Cop1CvtDW_neg, test) { | |
2253 typedef double (*SimpleCode)() DART_UNUSED; | |
2254 EXPECT(test != NULL); | |
2255 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
2256 EXPECT_FLOAT_EQ(-42.0, res, 0.001); | |
2257 } | |
2258 | |
2259 | |
2260 ASSEMBLER_TEST_GENERATE(Cop1CvtSD, assembler) { | |
2261 __ LoadImmediate(D2, -42.42); | |
2262 __ cvtsd(F2, D2); | |
2263 __ cvtds(D0, F2); | |
2264 __ Ret(); | |
2265 } | |
2266 | |
2267 | |
2268 ASSEMBLER_TEST_RUN(Cop1CvtSD, test) { | |
2269 typedef double (*SimpleCode)() DART_UNUSED; | |
2270 EXPECT(test != NULL); | |
2271 double res = EXECUTE_TEST_CODE_DOUBLE(SimpleCode, test->entry()); | |
2272 EXPECT_FLOAT_EQ(-42.42, res, 0.001); | |
2273 } | |
2274 | |
2275 | |
2276 // Called from assembler_test.cc. | |
2277 // RA: return address. | |
2278 // A0: value. | |
2279 // A1: growable array. | |
2280 // A2: current thread. | |
2281 ASSEMBLER_TEST_GENERATE(StoreIntoObject, assembler) { | |
2282 __ addiu(SP, SP, Immediate(-3 * kWordSize)); | |
2283 __ sw(CODE_REG, Address(SP, 2 * kWordSize)); | |
2284 __ sw(THR, Address(SP, 1 * kWordSize)); | |
2285 __ sw(RA, Address(SP, 0 * kWordSize)); | |
2286 __ mov(THR, A2); | |
2287 __ StoreIntoObject(A1, FieldAddress(A1, GrowableObjectArray::data_offset()), | |
2288 A0); | |
2289 __ lw(RA, Address(SP, 0 * kWordSize)); | |
2290 __ lw(THR, Address(SP, 1 * kWordSize)); | |
2291 __ lw(CODE_REG, Address(SP, 2 * kWordSize)); | |
2292 __ addiu(SP, SP, Immediate(3 * kWordSize)); | |
2293 __ Ret(); | |
2294 } | |
2295 | |
2296 | |
2297 ASSEMBLER_TEST_GENERATE(Semaphore, assembler) { | |
2298 __ EnterFrame(); | |
2299 __ LoadImmediate(T0, 40); | |
2300 __ LoadImmediate(T1, 42); | |
2301 __ Push(T0); | |
2302 Label retry; | |
2303 __ Bind(&retry); | |
2304 __ ll(T0, Address(SP)); | |
2305 __ mov(T2, T1); | |
2306 __ sc(T2, Address(SP)); // T1 == 1, success | |
2307 __ LoadImmediate(T3, 1); | |
2308 __ bne(T2, T3, &retry); // NE if context switch occurred between ll and sc | |
2309 __ Pop(V0); // 42 | |
2310 __ LeaveFrameAndReturn(); | |
2311 } | |
2312 | |
2313 | |
2314 ASSEMBLER_TEST_RUN(Semaphore, test) { | |
2315 EXPECT(test != NULL); | |
2316 typedef int (*Semaphore)() DART_UNUSED; | |
2317 EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(Semaphore, test->entry())); | |
2318 } | |
2319 | |
2320 | |
2321 } // namespace dart | |
2322 | |
2323 #endif // defined TARGET_ARCH_MIPS | |
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