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Issue 2666133002: Added new type of unit test, RAW_UNIT_TEST_CASE, which is used for tests that can be flaky if run w… (Closed)
Patch Set: Fixed name of UNIT_TEST_CASE macro Created 3 years, 10 months ago
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1 // Copyright (c) 2012, the Dart project authors. Please see the AUTHORS file 1 // Copyright (c) 2012, the Dart project authors. Please see the AUTHORS file
2 // for details. All rights reserved. Use of this source code is governed by a 2 // for details. All rights reserved. Use of this source code is governed by a
3 // BSD-style license that can be found in the LICENSE file. 3 // BSD-style license that can be found in the LICENSE file.
4 4
5 #include "platform/assert.h" 5 #include "platform/assert.h"
6 #include "vm/globals.h" 6 #include "vm/globals.h"
7 #include "vm/bitfield.h" 7 #include "vm/bitfield.h"
8 #include "vm/unit_test.h" 8 #include "vm/unit_test.h"
9 9
10 namespace dart { 10 namespace dart {
11 11
12 UNIT_TEST_CASE(BitFields) { 12 VM_UNIT_TEST_CASE(BitFields) {
13 class TestBitFields : public BitField<uword, int32_t, 1, 8> {}; 13 class TestBitFields : public BitField<uword, int32_t, 1, 8> {};
14 EXPECT(TestBitFields::is_valid(16)); 14 EXPECT(TestBitFields::is_valid(16));
15 EXPECT(!TestBitFields::is_valid(256)); 15 EXPECT(!TestBitFields::is_valid(256));
16 EXPECT_EQ(0x00ffU, TestBitFields::mask()); 16 EXPECT_EQ(0x00ffU, TestBitFields::mask());
17 EXPECT_EQ(0x001feU, TestBitFields::mask_in_place()); 17 EXPECT_EQ(0x001feU, TestBitFields::mask_in_place());
18 EXPECT_EQ(1, TestBitFields::shift()); 18 EXPECT_EQ(1, TestBitFields::shift());
19 EXPECT_EQ(8, TestBitFields::bitsize()); 19 EXPECT_EQ(8, TestBitFields::bitsize());
20 EXPECT_EQ(32U, TestBitFields::encode(16)); 20 EXPECT_EQ(32U, TestBitFields::encode(16));
21 EXPECT_EQ(16, TestBitFields::decode(32)); 21 EXPECT_EQ(16, TestBitFields::decode(32));
22 EXPECT_EQ(2U, TestBitFields::update(1, 16)); 22 EXPECT_EQ(2U, TestBitFields::update(1, 16));
23 } 23 }
24 24
25 } // namespace dart 25 } // namespace dart
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