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| 1 /******************************************************************** | |
| 2 * COPYRIGHT: | |
| 3 * Copyright (c) 1997-2011, International Business Machines Corporation and | |
| 4 * others. All Rights Reserved. | |
| 5 ********************************************************************/ | |
| 6 | |
| 7 | |
| 8 #ifndef _PUTILTEST_ | |
| 9 #define _PUTILTEST_ | |
| 10 | |
| 11 #include "intltest.h" | |
| 12 | |
| 13 /** | |
| 14 * Test putil.h | |
| 15 **/ | |
| 16 class PUtilTest : public IntlTest { | |
| 17 // IntlTest override | |
| 18 void runIndexedTest( int32_t index, UBool exec, const char* &name, char* par
); | |
| 19 public: | |
| 20 | |
| 21 // void testIEEEremainder(void); | |
| 22 void testMaxMin(void); | |
| 23 | |
| 24 private: | |
| 25 // void remainderTest(double x, double y, double exp); | |
| 26 void maxMinTest(double a, double b, double exp, UBool max); | |
| 27 | |
| 28 // the actual tests; methods return the number of errors | |
| 29 void testNaN(void); | |
| 30 void testPositiveInfinity(void); | |
| 31 void testNegativeInfinity(void); | |
| 32 void testZero(void); | |
| 33 | |
| 34 // subtests of testNaN | |
| 35 void testIsNaN(void); | |
| 36 void NaNGT(void); | |
| 37 void NaNLT(void); | |
| 38 void NaNGTE(void); | |
| 39 void NaNLTE(void); | |
| 40 void NaNE(void); | |
| 41 void NaNNE(void); | |
| 42 | |
| 43 }; | |
| 44 | |
| 45 #endif | |
| 46 //eof | |
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