Fix typo in newly introduced mips assembly tests.

runtime/vm/assembler_mips_test.cc

 // Copyright (c) 2013, the Dart project authors.  Please see the AUTHORS file
 // for details. All rights reserved. Use of this source code is governed by a
 // BSD-style license that can be found in the LICENSE file.
 
 #include "vm/globals.h"
 #if defined(TARGET_ARCH_MIPS)
 
 #include "vm/assembler.h"
 #include "vm/cpu.h"
 #include "vm/os.h"
@@ skipping 2000 matching lines @@
   __ LoadImmediate(T0, 0x7FF80000);
   __ mtc1(ZR, F2);  // Load upper bits of NaN.
   __ mtc1(T0, F3);  // Load lower bits of NaN.
   __ truncwd(F0, D1);
   __ mfc1(V0, F0);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1TruncWD_NaN, test) {
-  typedef double (*SimpleCode)() DART_UNUSED;
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   EXPECT_EQ(kMaxInt32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1TruncWD_Inf, assembler) {
   __ LoadImmediate(T0, 0x7FF00000);  // +inf
   __ mtc1(ZR, F2);
   __ mtc1(T0, F3);
   __ truncwd(F0, D1);
   __ mfc1(V0, F0);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1TruncWD_Inf, test) {
-  typedef double (*SimpleCode)() DART_UNUSED;
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   EXPECT_EQ(kMaxInt32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1TruncWD_Overflow, assembler) {
   __ LoadImmediate(D1, 2.0*kMaxInt32);
   __ truncwd(F0, D1);
   __ mfc1(V0, F0);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1TruncWD_Overflow, test) {
-  typedef double (*SimpleCode)() DART_UNUSED;
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   EXPECT_EQ(kMaxInt32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1TruncWD_Underflow, assembler) {
   __ LoadImmediate(D1, 2.0*kMinInt32);
   __ truncwd(F0, D1);
   __ mfc1(V0, F0);
   __ Ret();
 }
 
 
 ASSEMBLER_TEST_RUN(Cop1TruncWD_Underflow, test) {
-  typedef double (*SimpleCode)() DART_UNUSED;
+  typedef int (*SimpleCode)() DART_UNUSED;
   EXPECT(test != NULL);
   EXPECT_EQ(kMaxInt32, EXECUTE_TEST_CODE_INT32(SimpleCode, test->entry()));
 }
 
 
 ASSEMBLER_TEST_GENERATE(Cop1CvtDW, assembler) {
   __ LoadImmediate(T0, 42);
   __ mtc1(T0, F2);
   __ cvtdw(D0, F2);
   __ Ret();
@@ skipping 133 matching lines @@
 ASSEMBLER_TEST_RUN(Semaphore, test) {
   EXPECT(test != NULL);
   typedef int (*Semaphore)() DART_UNUSED;
   EXPECT_EQ(42, EXECUTE_TEST_CODE_INT32(Semaphore, test->entry()));
 }
 
 
 }  // namespace dart
 
 #endif  // defined TARGET_ARCH_MIPS