test/unittests/compiler/interpreter-assembler-unittest.h - Issue 1518673002: Remove dummy control / effect edges from RMA Call nodes.

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Unified Diff: test/unittests/compiler/interpreter-assembler-unittest.h

Issue 1518673002: Remove dummy control / effect edges from RMA Call nodes. (Closed) Base URL: https://chromium.googlesource.com/v8/v8.git@master

Patch Set: Created 5 years ago

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Index: test/unittests/compiler/interpreter-assembler-unittest.h

diff --git a/test/unittests/compiler/interpreter-assembler-unittest.h b/test/unittests/compiler/interpreter-assembler-unittest.h

index 8e43b8a7e712f108a28e21660bc194ea42f3b740..31b82228fd809a5c89127c479f1bb44a2430af53 100644

--- a/test/unittests/compiler/interpreter-assembler-unittest.h

+++ b/test/unittests/compiler/interpreter-assembler-unittest.h

@@ -36,10 +36,6 @@ class InterpreterAssemblerTest : public TestWithIsolateAndZone {

const Matcher<Node*>& base_matcher,

const Matcher<Node*>& index_matcher,

const Matcher<Node*>& value_matcher);

- template <class... A>

- Matcher<Node*> IsCall(

- const Matcher<const CallDescriptor*>& descriptor_matcher,

- A... args);

Matcher<Node*> IsBytecodeOperand(int offset);

Matcher<Node*> IsBytecodeOperandSignExtended(int offset);