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Unified Diff: runtime/vm/assembler_ia32_test.cc

Issue 1272223002: VM: Simplify assembler test by removing unused parameter. (Closed) Base URL: git@github.com:dart-lang/sdk.git@master
Patch Set: Created 5 years, 4 months ago
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Index: runtime/vm/assembler_ia32_test.cc
diff --git a/runtime/vm/assembler_ia32_test.cc b/runtime/vm/assembler_ia32_test.cc
index b5415740eec97a438cce4ad15b6f99d63b73d0f6..2ce9da22a365b1152ef548150ebd62d2f064891f 100644
--- a/runtime/vm/assembler_ia32_test.cc
+++ b/runtime/vm/assembler_ia32_test.cc
@@ -3394,17 +3394,14 @@ ASSEMBLER_TEST_RUN(TestRepMovsBytes, test) {
// Called from assembler_test.cc.
ASSEMBLER_TEST_GENERATE(StoreIntoObject, assembler) {
__ pushl(THR);
- __ pushl(CTX);
- __ movl(CTX, Address(ESP, 3 * kWordSize));
- __ movl(EAX, Address(ESP, 4 * kWordSize));
- __ movl(ECX, Address(ESP, 5 * kWordSize));
- __ movl(THR, Address(ESP, 6 * kWordSize));
+ __ movl(EAX, Address(ESP, 2 * kWordSize));
+ __ movl(ECX, Address(ESP, 3 * kWordSize));
+ __ movl(THR, Address(ESP, 4 * kWordSize));
__ pushl(EAX);
__ StoreIntoObject(ECX,
FieldAddress(ECX, GrowableObjectArray::data_offset()),
EAX);
__ popl(EAX);
- __ popl(CTX);
__ popl(THR);
__ ret();
}
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