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Unified Diff: tests/BitSetTest.cpp

Issue 100113004: Use DEFINE_TESTCLASS_SHORT macro in tests. (Closed) Base URL: https://skia.googlecode.com/svn/trunk
Patch Set: rebase Created 7 years ago
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Index: tests/BitSetTest.cpp
diff --git a/tests/BitSetTest.cpp b/tests/BitSetTest.cpp
index 7139495217534fe345b1dc33becf64921ba76b3f..bdfe9978e63a6629e6193d11b7e5e345001f8810 100644
--- a/tests/BitSetTest.cpp
+++ b/tests/BitSetTest.cpp
@@ -1,14 +1,15 @@
-
/*
* Copyright 2011 Google Inc.
*
* Use of this source code is governed by a BSD-style license that can be
* found in the LICENSE file.
*/
+
#include "Test.h"
+#include "TestClassDef.h"
#include "SkBitSet.h"
-static void TestBitSet(skiatest::Reporter* reporter) {
+DEF_TEST(BitSet, reporter) {
SkBitSet set0(65536);
REPORTER_ASSERT(reporter, set0.isBitSet(0) == false);
REPORTER_ASSERT(reporter, set0.isBitSet(32767) == false);
@@ -74,6 +75,3 @@ static void TestBitSet(skiatest::Reporter* reporter) {
set2 = set2;
REPORTER_ASSERT(reporter, set2 == set3);
}
-
-#include "TestClassDef.h"
-DEFINE_TESTCLASS("BitSet", BitSetTest, TestBitSet)
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